研究目的
To evaluate how composition, structure and morphology of CdSe-based layers formed on the surface of polyamide (PA) depend on the conditions applied for their formation, specifically the duration of seleniumization and temperature of cadmiumization.
研究成果
The morphology of CdSe-based layers on PA is uneven and rough, forming as islands that agglomerate. Layer height decreases with prolonged seleniumization and higher cadmiumization temperature, while roughness changes variably. XPS and XRD confirm the presence of CdSe, Cd(OH)2, and CdO, with composition dependent on formation conditions. This provides insights for optimizing coating processes in optoelectronics applications.
研究不足
The study is limited to specific conditions of seleniumization duration and cadmiumization temperature; other parameters or substrates were not explored. The overlapping XRD peaks of CdSe and PA may restrict detailed phase analysis. The method may not be optimized for uniform layer formation, as indicated by uneven morphology.
1：Experimental Design and Method Selection:
The study uses a sorption-diffusion method to form CdSe-based layers on PA substrate. This involves sequential treatment with K2SeS2O6 solution (seleniumization) and Cd(CH3COO)2 solution (cadmiumization), followed by analysis using AFM, SEM, XPS, XRD, and atomic absorption spectroscopy to investigate morphology and composition.
2：Sample Selection and Data Sources:
Polyamide 6 (PA) films (Tecamid 6, 500 μm thick) from Ensinger GmbH were used. Samples were prepared by boiling in water to remove residues, drying, and incubating over CaCl2 before treatments.
3：List of Experimental Equipment and Materials:
Chemicals include K2SeS2O6, Cd(CH3COO)2·2H2O, HCl, CaCl2, and deionized water. Equipment includes atomic absorption spectrometers (Perkin Elmer Analyst 400, Varian spectrAA-20 plus), XRD diffractometer (Bourevestnik DRON-6), XPS spectrometer (VG Scientific Escalab Mark 2), AFM (Nanosurf EasyScan2), and SEM (Raith eLINE).
4：Experimental Procedures and Operational Workflow:
PA films were seleniumized in 0.05 mol/dm3 K2SeS2O6 acidified with HCl at 60°C for 1-3.5 hours, rinsed, dried, and then cadmiumized in 0.1 mol/dm3 Cd(CH3COO)2 at 50-70°C for 10 minutes, followed by rinsing and drying. Morphology and composition were analyzed using the specified instruments.
5：05 mol/dm3 K2SeS2O6 acidified with HCl at 60°C for 1-5 hours, rinsed, dried, and then cadmiumized in 1 mol/dm3 Cd(CH3COO)2 at 50-70°C for 10 minutes, followed by rinsing and drying. Morphology and composition were analyzed using the specified instruments.
Data Analysis Methods:
5. Data Analysis Methods: Data from AFM and SEM were analyzed for height and roughness parameters. XPS and XRD data were processed using software like Search Match, Conv X, X-fit, and Excel to determine elemental composition and phase structures.
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