研究目的
To investigate the effect of the degree of inversion on the Raman scattering and UV-Vis-NIR absorptivity of zinc ferrite (ZnFe2O4), and to propose a new assignment for the Raman active internal modes and electronic transitions.
研究成果
The degree of inversion significantly affects the Raman scattering and UV-Vis-NIR reflectivity of ZnFe2O4, with increased inversion leading to darker samples due to enhanced absorption from tetrahedrally coordinated Fe3+ ions. However, the optical band gap remains unchanged. A new assignment for Raman active modes and electronic transitions is proposed, emphasizing the role of cation disorder. The findings provide insights for applications in optoelectronics and catalysis, suggesting that inversion degree can be tuned to modify optical properties without altering the band gap.
研究不足
The study is limited to bulk polycrystalline samples with degrees of inversion up to 0.20; higher inversions or nanoparticle forms were not explored. Theoretical calculations have inherent approximations, such as harmonic approximations in vibrational frequency calculations, and may not fully capture all experimental nuances. The quenching process might not perfectly preserve high-temperature states, and the range of inversion degrees is relatively narrow.
1:Experimental Design and Method Selection:
The study involved synthesizing polycrystalline ZnFe2O4 samples with varying degrees of inversion using a solid-state reaction method, followed by characterization using XRD, M?ssbauer spectroscopy, Raman spectroscopy, UV-Vis-NIR spectroscopy, and ab initio calculations to analyze structural, magnetic, and optical properties.
2:Sample Selection and Data Sources:
Five ZFO samples were prepared by calcining stoichiometric mixtures of ZnO and Fe2O3 powders at different temperatures (773 K to 1173 K) and quenching in cold water to achieve degrees of inversion from 0.07 to 0.20. Data were collected from experimental measurements and theoretical simulations.
3:07 to Data were collected from experimental measurements and theoretical simulations. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included an StadiMP diffractometer, MIMOS II M?ssbauer spectrometer, Bruker Senterra micro-Raman spectrometer, Agilent Carry 5000 UV-Vis-NIR spectrometer, JEOL JSM-6700F SEM, and computational tools like CRYSTAL14 and VASP. Materials included ZnO (Sigma Aldrich, ≥99.0%) and Fe2O3 (Sigma Aldrich, ≥99.0%).
4:0%) and Fe2O3 (Sigma Aldrich, ≥0%). Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Samples were synthesized by mixing powders, calcining, pressing into pellets, and further calcining at specific temperatures with controlled heating and cooling rates. Characterization involved XRD for structural analysis, M?ssbauer for cation distribution, Raman for vibrational modes, UV-Vis-NIR for optical properties, and SEM for morphology. Ab initio calculations were performed for theoretical support.
5:Data Analysis Methods:
Data were analyzed using Rietveld refinement with TOPAS software, least-squares fitting for M?ssbauer spectra, Gaussian deconvolution for Raman and UV-Vis-NIR spectra, and computational methods for theoretical predictions.
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Bruker Senterra micro-Raman spectrometer
Senterra
Bruker
Confocal Raman spectrometer for measuring depolarized spectra in backscattering geometry.
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Olympus BX 51 microscope
BX 51
Olympus
Microscope part of the Raman spectrometer for focusing the laser beam.
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Agilent Carry 5000 device
Cary 5000
Agilent
UV-Vis-NIR spectrometer equipped with an external DRA-2500 Diffuse Reflectance Accessory.
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DRA-2500 Diffuse Reflectance Accessory
DRA-2500
Agilent
Accessory for diffuse reflectance measurements with the Cary 5000 spectrometer.
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JEOL JSM-6700F scanning electron microscope
JSM-6700F
JEOL
Used for structural and morphological analysis of samples with a lower secondary electron image detector.
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StadiMP diffractometer
StadiMP
Stoe & Cie.
Used for powder X-ray diffraction data collection with monochromatized MoKa1 radiation.
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Mythen2 detector
Mythen2 1K
Dectris
Detector for X-ray diffraction measurements.
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Bruker DIFFRACplus TOPAS software
V4.2
Bruker AXS Inc.
Software for Rietveld refinements of XRD data.
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Miniaturized M?ssbauer Spectrometer
MIMOS II
Used for M?ssbauer measurements in transmission mode with a 57Co/Rh source.
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CRYSTAL14 program package
Computational software for ab initio calculations of Raman spectra using triple-z basis sets.
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Vienna ab initio Simulation Package
VASP version 5.4.4
Software for ab initio calculations of optical spectra using GW0 and Bethe-Salpeter equations.
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Spectroflame and Spectro Arcos
Spectro Analytical Instruments
ICP-OES equipment for elemental analysis by measuring optical emission.
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ultraWAVE microwave digestion system
ultraWAVE
MLS GmbH
System for sample digestion prior to ICP-OES analysis.
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ZnO powder
Sigma Aldrich
Raw material for synthesis, purity ≥99.0%.
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Fe2O3 powder
Sigma Aldrich
Raw material for synthesis, purity ≥99.0%.
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