[IEEE 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) - Waikoloa Village, HI (2018.6.10-2018.6.15)] 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) - Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

摘要： An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.