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Observation of Optical Properties of Gold Thin Films Using Spectroscopic Ellipsometry
摘要： In this research work, an attempt has been made to synthesize nano-structured gold thin films over Silicon dioxide (SiO2) coated on Silicon(Si) Substrate using three deposition techniques namely DC Sputtering, Pulsed DC Sputtering, and Pulsed Laser Deposition(PLD). Optical measurements using spectroscopic ellipsometry showed that the dielectric constants of the films differed between films synthesized by different synthesis routes. This was expected because different synthesis routes yielded different microstructure. The difference in microstructures results in differences in electronic structure and therefore resulting in the differences on the optical response.
关键词： Spectroscopic ellipsometry,GIXRD,Gold thin films,Pseudo dielectric functions
更新于2025-09-23 15:19:57
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Polarization Dependent Reflectivity and Transmission for Cd1-Xznxte/GaAs(001) Epifilms in the Far-Infrared and Near-Infrared to Ultraviolet Region
摘要： The results of a comprehensive experimental and theoretical study is reported to empathize the optical properties of binary GaAs, ZnTe, CdTe and ternary Cd1-xZnxTe (CZT) alloys in the two energy regions: (i) far-infrared (FIR), and (ii) near-infrared (NIR) to ultraviolet (UV). A high resolution Fourier transform infrared spectrometer is used to assess the FIR response of GaAs, ZnTe, CdTe and CZT alloys in the entire composition 1.0 ≥ x ≥ 0 range. Accurate model dielectric functions are established appositely to extort the optical constants of the binary materials. The simulated dielectric functions are meticulously appraised in the FIR → NIR → UV energy range by comparing them against the existing spectroscopic FTIR and ellipsometry data. These outcomes are expended eloquently for evaluating the polarization dependent reflectivity R(λ) and transmission T(λ) spectra of ultrathin CZT/GaAs (001) epifilms. A reasonably accurate assessment of the CZT film thickness by reflectivity study has offered a credible testimony for characterizing any semiconducting epitaxially grown nanostructured materials of technological importance.
关键词： Dielectric functions,Fourier transform infrared spectroscopy,Transmission,Reflectivity,Ellipsometry,Epilayers
更新于2025-09-16 10:30:52