Analysis of moisture-induced degradation of thin-film photovoltaic module

摘要： To enhance the reliability of the thin-film solar cell technologies, it is required to analyze and understand the moisture-induced degradation. In this study, the moisture induced degradation of glass-to-glass CIGS module are comprehensively analyzed. CIGS modules are fabricated and tested under damp-heat conditions with periodical measurement of the electrical characteristics. Individual layers of the module are also investigated experimentally and the moisture induced degradation is discussed. A modified method to extract the diode model parameters from degraded I–V curves is proposed and applied to the degraded data. Finally, the degradation rates are modelled and the effect of model parameters degradation on the power of module are quantitatively compared. It suggests that the power degradation of CIGS module under the damp-heat environment is more affected by the enhanced recombination of the absorber layer than the degradation of the metal layer or the leakage over layers.