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Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films
摘要： Purpose – This paper aims to determine the crystallite size and microstrain values of AgSiN thin films using potential approach called approximation method. This method can be used as a replacement for other determination methods such as Williamson-Hall (W-H) plot and Warren-Averbach analysis. Design/methodology/approach – The monolayer AgSiN thin films on Ti6Al4V alloy were fabricated using magnetron sputtering technique. To evaluate the crystallite size and microstrain values, the thin films were deposited under different bias voltage ((cid:1)75, (cid:1)150 and (cid:1)200 V). X-ray diffraction (XRD) broadening profile along with approximation method were used to determine the crystallite size and microstrain values. The reliability of the method was proved by comparing it with scanning electron microscopy graph and W-H plot method. The second parameters’ microstrain obtained was used to project the residual stress present in the thin films. Further discussion on the thin films was done by relating the residual stress with the adhesion strength and the thickness of the films. Findings – XRD-approximation method results revealed that the crystallite size values obtained from the method were in a good agreement when it is compared with Scherer formula and W-H method. Meanwhile, the calculations for thin films corresponding residual stresses were correlated well with scratch adhesion critical loads with the lowest residual stress was noted for sample with lowest microstrain and has thickest thickness among the three samples. Practical implications – The fabricated thin films were intended to be used in antibacterial applications. Originality/value – Up to the knowledge from literature review, there are no reports on depositing AgSiN on Ti6Al4V alloy via magnetron sputtering to elucidate the crystallite size and microstrain properties using the approximation method.
关键词： AgSiN thin films,XRD-approximation method,Microstrain,Crystallite size
更新于2025-09-23 15:21:01
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Comment on “An effect of novel Nd3+ doping on physical properties of nebulizer spray pyrolysis fabricated ZnS thin films for optoelectronic technology" by A. Jesu Jebathew, M. Karunakaran, K. Deva Arun Kumar, S. Valanarasu, V. Ganesh, Mohd. Shkir, S. AlFaify, A. Kathalingam, in Physica B: Physics of Condensed Matter (2019)
摘要： The present commentary connected with the errors and mistakes made in the structural and morphological properties of Nd3+ doped ZnS thin films by nebulizer spray pyrolysis.
关键词： ZnS thin films,Microstrain,Structural properties,X-ray diffraction
更新于2025-09-19 17:13:59
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Direct nanocrystallite size investigation in microstrained mixed phase TiO2 nanoparticles by PCA of Raman spectra
摘要： Mixed phase anatase and rutile TiO2 nanoparticles (30-67 % R/A) have been synthesized by single step laser pyrolysis. Parallel studies by XRD and Raman spectroscopy suggested possible deforming microstress inside certain samples, due to boundary interactions between neighbouring nanocrystallites in nanoparticles, phase instabilities and/or O/C contents. Microstress in nanoparticles supports anatase phase stability in competition with rutile phase. Williamson-Hall plot was used to evaluate crystallite size and strain. A tensile global microstrain in anatase crystallites, was observed for elevated C content titania nanoparticles, together with compressive microstrain in crystallites within O deficient TiO2 nanoparticles. XPS and TEM characterization opens insights into the processes behind this type of behaviour. Principal Component Analysis of Raman spectra was applied for batch auto-characterization of mixed phase nanoparticles, with emphasis upon the method ability to simultaneously appreciate crystallite size for both anatase and rutile phase. The method focuses on covariational matrix of multiple samples Raman spectra. It provides results in good agreement with XRD calculated crystallite dimensions for unstrained titania, while for samples with microstrains it returns the size closer to the one predicted by Williamson-Hall plot.
关键词： Microstrain,Anatase,Principal Component Analysis (PCA),Raman Spectroscopy,Williamson-Hall,Rutile,TiO2 nanoparticles
更新于2025-09-09 09:28:46