[IEEE 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro) - Bento Gon?alves, Brazil (2018.8.27-2018.8.31)] 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro) - Non uniformity correction in a Long Wave Infrared Focal Plane Array as a function of the higher calibration temperature

摘要： It is well known that every detector in a Focal Plane Array (FPA) has a different responsivity and offset. These variations result in a specific kind of noise, the Fixed Pattern Noise (FPN) or spatial noise. During the image processing, those pixels who has a large deviation in responsivity are considered a bad pixel, and has its value removed of FPA. Knowing the answer of in a FPA all those pixels are the first test procedure characterization. However, during the bad pixels analysis it is necessary to choose two reference temperatures, calibration points, and those temperature affects important parameters such as Uniformity, Noise Equivalent Temperature Difference (NETD) and Signal Transfer Function (SiTF). This work will study the influence of higher calibration temperature on the Non-Uniformity Correction (NUC) quality.