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[IEEE 2018 IEEE 15th International Conference on Group IV Photonics (GFP) - Cancun (2018.8.29-2018.8.31)] 2018 IEEE 15th International Conference on Group IV Photonics (GFP) - Estimation of Optical Modulator Efficiency from Electrical Characteristics
摘要： We propose a new testing method to estimate the efficiency of Mach-Zehnder modulators by using only electrical characteristics, which is suitable for wafer-level testing. The breakdown voltage of the phase modulator shows a clear relationship with modulator efficiency.
关键词： Silicon photonics,Wafer-level test,Optical modulator
更新于2025-09-23 15:22:29
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[IEEE 2019 28th Wireless and Optical Communications Conference (WOCC) - Beijing, China (2019.5.9-2019.5.10)] 2019 28th Wireless and Optical Communications Conference (WOCC) - Relaxed Polar Codes under AWGN Channels with Low Complexity and Low Latency
摘要： In this paper, we demonstrate a wafer-level sorting test solution developed for quad-channel linear driver to be used in a 400G silicon photonics transceiver module. In-house built tester-on-a-board (TOB) system was used to provide power and control signals to the device-under-test (DUT), as well as conduct parametric tests. RF switch matrix was implemented to support multi-channel RF tests up to 50GHz. This wafer sorting test solution covers contact tests, power consumption tests, single-ended and true-mode differential full S-parameter tests, output signal swing and total harmonic tests. This work enables wafer-level driver die sorting capability for next-generation 400G silicon photonics coherent transceiver module.
关键词： wafer-level test,silicon photonics,transceiver module,driver die
更新于2025-09-11 14:15:04