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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Frequency Dependence Evaluation of CENAM Calculable Resistors
摘要： This paper presents the evaluation results of 1 k? and 10 k? CENAM calculable resistors using as reference a 1 k? METAS calculable resistor, by means of 1:1 and 10:1 ratios measurements, respectively. The measurements show an agreement better than 0.35 μ?/? through the audio-frequency range for the 10 k? CENAM resistor. An analysis of the possible reasons of the observed linear frequency dependence in the 1 k? CENAM calculable resistors is also presented.
关键词： reference standard,frequency dependence,metrology,Calculable resistor
更新于2025-09-10 09:29:36
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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Calibration of AC Shunts at Frequencies Up to 10 kHz Using Digital Sampling
摘要： This paper describes a calibration system for AC shunts using digital sampling. It provides both ratio errors and phase displacements of a shunt under test with respect to a reference shunt. In its basic configuration, the calibration system operates at currents of up to 10 A and frequencies of up to 10 kHz. The expanded uncertainties (k = 2) of the described calibration system are estimated to be better than 30 μA/A for magnitude and 30 μrad for phase at 10 kHz, and lower than these at lower frequencies.
关键词： calibration,calculable resistor,current comparator,current measurement,measurement uncertainty,AC shunt,measurement standards
更新于2025-09-10 09:29:36