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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Defect Prediction Approach to enhance Static Fault Localization of Functional Logic Failure Defects using NIR Photon Emission Microscopy
摘要： Studies on defect induced emission characteristics have significantly enhanced the effectiveness of static fault localization on functional logic failures due to open and short defects. In this paper, using the distinctive differences in the defect-induced emission characteristic between open and short defects, together with layout trace and analysis, a defect prediction approach has been derived. It assisted in the hypothesis of the defect type, narrowing down the defect location within long failure net(s) and even pin-pointing the exact defect location in some cases. Successful case studies on advanced technology node devices were used to describe four different emission signatures of open and short defects and the effective application of aforementioned approach in isolating the defect.
关键词： Static Fault Localization,Short defect,Defect Prediction,Photon Emission Microscopy,Functional failures,Open defect
更新于2025-09-23 15:21:01
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[IEEE 2017 International Conference on Optical Network Design and Modeling (ONDM) - Budapest (2017.5.15-2017.5.18)] 2017 International Conference on Optical Network Design and Modeling (ONDM) - A probabilistic approach for failure localization
摘要： This work considers the problem of fault localization in transparent optical networks. The aim is to localize single-link failures by utilizing statistical machine learning techniques trained on data that describe the network state upon current and past failure incidents. In particular, a Gaussian Process (GP) classi?er is trained on historical data extracted from the examined network, with the goal of modeling and predicting the failure probability of each link therein. To limit the set of suspect links for every failure incident, the proposed approach is complemented with the utilization of a Graph-Based Correlation heuristic. The proposed approach is tested on a dataset generated for an OFDM-based optical network, demonstrating that it achieves a high localization accuracy. The proposed scheme can be used by service providers for reducing the Mean-Time-To-Repair of the failure.
关键词： Graph-Based Correlation,OFDM,Gaussian Process,transparent optical networks,fault localization
更新于2025-09-04 15:30:14