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oe1(光电查) - 科学论文

2 条数据
?? 中文（中国） ▾

  • Reconstructing charge-carrier dynamics in porous silicon membranes from time-resolved interferometric measurements

    摘要： We performed interferometric time-resolved simultaneous reflectance and transmittance measurements to investigate the carrier dynamics in pump-probe experiments on thin porous silicon membranes. The experimental data was analysed by using a method built on the Wentzel-Kramers-Brillouin approximation and the Drude model, allowing us to reconstruct the excited carriers’ non-uniform distribution in space and its evolution in time. The analysis revealed that the carrier dynamics in porous silicon, with ~50% porosity and native oxide chemistry, is governed by the Shockley-Read-Hall recombination process with a characteristic time constant of 375 picoseconds, whereas diffusion makes an insignificant contribution as it is suppressed by the high rate of scattering.

    关键词： carrier dynamics,porous silicon,Drude model,Shockley-Read-Hall recombination,interferometric measurements

    更新于2025-09-11 14:15:04

  • Improving Interferometry Instrumentation by Mixing Stereoscopy for 2π Ambiguity Solving

    摘要： Phase measurements obtained by high-coherence interferometry are restricted by the 2π ambiguity to height differences smaller than λ/2. A further restriction considers linear and nonlinear aberrations evolving in most interferometric systems due to the CCD-type array detectors. The authors present a new method to overcome the 2π ambiguity in interferometry when using a stereoscopic approach. In this method, a reconstructed wavefront reflected from an object was propagated into two different angles to obtain two different images of the object. These two different images were subsequently processed by stereo algorithms to resolve the 2π ambiguity. Such a method of wavefront propagation may enable several applications such as focusing and resolving the 2π ambiguity, as described in the article.

    关键词： Wavefront Propagation,Stereoscopy,2π Ambiguity,Coupling Techniques,Interferometric Measurements

    更新于2025-09-04 15:30:14