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Three-dimensional Nanoscale Mapping of Porosity in Solution-Processed ITO Multilayer Thin Films for Patternable Transparent Electrodes
摘要： Indium tin oxide (ITO) films constitute components of many layered heterostructures used for emergent technologies beyond conventional optoelectronics. Compositional and morphological changes have a direct impact on the device’s performance. Hence control over the morphology with advanced multimodal characterization approaches are required to evaluate the devices. Herein multilayer ITO films deposited by spin coating were quantified in nanoscale detail in three dimensions by combining results from depth-sensitive neutron reflectometry (NR), non-contact topographic AFM images and cross-sectional SEM images. Films with different number of deposited layers were visually transparent even though the topmost layer was as high as 60% porous, with porosity gradually decreasing as the number of the underneath sublayers increased. Surface and interfacial roughness through the total film and individual layer thickness were obtained. NR data also furnished quantitative depth information on the films chemical composition and layer-by-layer bulk density, which has never been obtained before, providing a way to monitor and ultimately control the sheet resistivity via the pore network. When the same formulation is used for inkjet printing patterns, the larger pores disappear and the optical properties are improved to >90% transmittance at all visible wavelengths. All 5L films achieved sheet resistivities as low as 10-2 ?-cm and can therefore be used as patternable transparent electrodes for many devices including liquid crystal displays.
关键词： thin multilayer film,neutron reflectometry,depth density distribution,neutron absorption reflectometry,Indium tin oxide,porosity,structure chemical depth profile,off-specular neutron scattering,layer by layer deposition
更新于2025-11-19 16:56:35
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Scaling effects on the optical properties of patterned nano-layered shape memory films
摘要： Nano-layered films of PVAc/PU systems were fabricated by forced assembly coextrusion method. The bulk shape memory properties of PVAc/PU systems were utilized to program nanoscale patterns such as diffraction grating which exhibit iridescence after patterning. A hot embossing process has been utilized to imprint diffraction grating patterns as nano-scale information onto the surface of the thin multilayer films. Three levels of hierarchy i.e. layer thickness, spacing and heights of patterns, governs the functionality of the patterned multilayer film. The time and temperature dependent viscoelastic shape memory behavior determines the opto-mechanical tunability of the film. Mechanical switching of the patterns also leads to optical switching of the films which corresponds to their efficiency of information retrieval. The recovery of patterns as well as the diffractive property depends on the layer thickness (l) of films and heights of patterns (h0). The results illustrate that the higher ratio of h0/l better is the recovery of the grating patterns and the corresponding diffractive properties. This scaling effect enables versatile applications in information security by tuning the layer structure of the multilayer shape memory films.
关键词： scaling effect,shape memory film,pattern programming,hot embossing,multilayer film,information security,diffractive optical element,thermal responsive optics
更新于2025-10-22 19:40:53
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A single light spot GC detector employing localized surface plasmon resonance of porous Au@SiO <sub/>2</sub> nanoparticle multilayer
摘要： This paper describes the synthesis of a nano-porous multilayered film consisting of Au@SiO2 nanoparticles. This film was used to miniaturize the size of a localized surface plasmon resonance (LSPR)-based capillary gas chromatograph (GC) detector. A layer-by-layer (LbL) approach with proper surface reaction sequences was used to create a multilayer structure that consisted of as many as five layers of Au@SiO2 nanoparticles. The center wavelength of LSPR was shifted from 520 to 634 nm due to the approximation of additional layers of nanoparticles. The vapor response time for this Au@SiO2 multilayer LSPR sensor was identical to that of an Au nanoparticle monolayer, which confirmed that this multilayer structure has a high level of gas permeability. The multilayer was synthesized inside a glass capillary for use as a GC detector. Due to the enhancement of absorbance, the gas chromatographic signal was obtained via a single spotlight that penetrated one side of the glass capillary and was then reflected by a silver mirror coated on the opposite side. The detection limits were ≤20 ng for cyclohexanone and m-xylene.
关键词： gas chromatography,localized surface plasmon resonance,multilayer film,miniaturization,Au@SiO2 nanoparticles,VOC detection
更新于2025-09-19 17:15:36
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Thickness measurement of multilayer film stack in perovskite solar cell using spectroscopic ellipsometry
摘要： The rapid surge in perovskite solar cell efficiency has necessitated the development of viable metrology techniques during device integration, paving the way for commercialization. Ellipsometry is considered the most appropriate technique for fast and accurate thickness measurement for large scale production. However, a precise and well-calibrated model is a prerequisite for this technique. While ellipsometry of individual device layers has been reported in recent perovskite literature, a comprehensive multilayer modeling approach is thus far unavailable. Perovskite optoelectronic devices generally consist of a six-layer film stack with three transparent layers required for optical absorption in the perovskite layer. Spin casted thin films, now common in this line of research, impart their own difficulties into ellipsometric modeling. Roughnesses at each heterointerface, similarities in optical spectra of transparent layers, and anomalous dispersion of perovskite are just a few of such challenges. In this work, we report the process of building an ellipsometry model from scratch for thickness measurement of methylammonium lead iodide (MAPI) perovskite and indium tin oxide (ITO)/hole transport layer (HTL) bilayer thin film stacks on a glass substrate. Three promising representatives of HTLs (CuI, Cu2O, and PEDOT:PSS) were studied. The models were extended to measure the individual layer thicknesses of the MAPI/HTL/ITO film stack on a glass substrate using the models developed for individual layers. Optical constants of all the representative thin films were thus extracted for a wide wavelength range (300 nm–900 nm).
关键词： perovskite solar cell,spectroscopic ellipsometry,multilayer film stack,optical constants,thickness measurement
更新于2025-09-12 10:27:22