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Color Reproduction Accuracy Promotion of 3D-Printed Surfaces Based on Microscopic Image Analysis
摘要： Full-color 3D printing technology is a powerful process to manufacture intelligent customized colorful objects with improved surface qualities; however, poor surface color optimization methods are the main impeding factors for its commercialization. As such, the paper explored the correlation between microstructure and color reproduction, then an assessment and prediction method of color optimization based on microscopic image analysis was proposed. The experimental models were divided into 24-color plates and 4-color cubes printed by ProJet 860 3D printer, then impregnated according to preset parameters, at last measured by a spectrophotometer and observed using both a digital microscope and a scanning electron microscope. The results revealed that the samples manifested higher saturation and smaller chromatic aberration (ΔE) after post-processing. Moreover, the brightness of the same color surface increased with the increasing soaked surface roughness. Further, reduction in surface roughness, impregnation into surface pores, and enhancement of coating transparency effectively improved the accuracy of color reproduction, which could be verified by the measured values. Finally, the chromatic aberration caused by positioning errors on different faces of the samples was optimized, and the value of ΔE for a black cube was reduced from 8.12 to 0.82, which is undetectable to human eyes.
关键词： Structural characterisation,Impregnating process,Scanning electron microscope,Image analysis,Color optimization,Full-color printing
更新于2025-11-21 11:18:25
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On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
摘要： The optimisation of the specular reflectance of solar collectors is a key parameter to increase the global yield of concentrated solar power (CSP) plants. In this work, the influence of filtered cathodic vacuum arc deposition parameters, particularly working pressure and deposition time, on the specular and diffuse reflectance of aluminium thin films, was studied. Changes in specular reflectance, measured by ultraviolet–visible and near-infrared spectroscopy (UV-vis-NIR) spectrophotometry, were directly correlated with thin film elemental concentration depth profiles, obtained by Rutherford backscattering spectrometry (RBS), and surface and cross-sectional morphologies as measured by scanning electron microscopy (SEM) and profilometry. Finally, atomic force microscopy (AFM) provided information on the roughness and growth mechanism of the films. The two contributions to the total reflectance of the films, namely diffuse and specular reflectance, were found to be deeply influenced by deposition conditions. It was proven that working pressure and deposition time directly determine the predominant factor. Specular reflectance varied from 12 to 99.8% of the total reflectance for films grown at the same working pressure of 0.1 Pa and with different deposition times. This transformation could not be attributed to an oxidation of the films as stated by RBS, but was correlated with a progressive modification of the roughness, surface, and bulk morphology of the samples over the deposition time. Hence, the evolution in the final optical properties of the films is driven by different growth mechanisms and the resulting microstructures. In addition to the originally addressed CSP applications the potential of the developed aluminium films for other application rather than CSP, such as, for example, reference material for spectroscopic diffuse reflectance measurements, is also discussed.
关键词： structural characterisation,total and specular reflectance,filtered cathodic vacuum arc,thin film deposition conditions
更新于2025-10-22 19:40:53