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Epitaxial processing optimization and photoluminescence spectra of CdTe thin films grown on highly dissimilar SrTiO3 (001) by molecular beam epitaxy
摘要： Single crystalline CdTe epitaxial layers (CTELs) are grown on a highly dissimilar (001) SrTiO3 (STO) by molecular beam epitaxy. The optimized growth temperature is determined to be in the range of 210 °C–270 °C. The crystalline structures of the CTELs are characterized by X-ray di?raction (XRD). The lattice parameters of the CTELs are revealed by the in-plane and out-of-plane reciprocal space mapping, electron microscopy and electron di?raction, and the epitaxial relationships between ?lm and substrate are further summarized as: (111)CdTe || (001)STO, [1?10]CdTe || [010]STO and [11?2]CdTe || [100]STO. The optimized full width at half maximum is yielded to be ~108 arcsec. The high crystalline quality and sharp interface are highlighted by the appearance of well-de?ned fringes of the XRD patterns, electron microscopy and photoluminescence spectra. Finally, the possible growth mechanisms are discussed and compliant epitaxial mechanism can well account for the epitaxial growth of the CdTe(111)/STO(001) epitaxial system. The achievement of the epitaxial growth of the CTELs on (001) STO with atomic ?atness and high-crystalline quality will avail to the potential application in photo-electric devices and the further epitaxy of the Hg1-xCdxTe-based infrared detector materials.
关键词： Photoluminescence,Cadmium telluride,Strontium titanate,Epitaxial layers,Molecular beam epitaxy,Perovskite substrate
更新于2025-09-10 09:29:36
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Substrate temperature dependent variation in the properties of cadmium telluride thin films deposited on glass
摘要： The present study relates to the variation in properties of cadmium telluride (CdTe) thin films deposited via electron beam and thermal vacuum evaporation methods at two different substrate temperatures. The influence of substrate temperature on structural, morphological, optical and electrical properties of CdTe thin films is investigated. For structural characterization, grazing incidence X-ray diffraction technique is used which revealed that thin films deposited at 200 °C temperature are more crystalline in nature as compare to the room temperature. The parameters such as average crystallite size (D), lattice strain (ε), number of crystallites per unit area (N) and texture coefficient TC (hkl) were calculated for both types of synthesized CdTe thin films. Surface morphology of thin films was recorded using scanning electron microscopy and found to be homogeneous in nature. The optical studies carried out using UV–Visible Spectrophotometer and Photoluminescence shown a decrease in band gap values for both electron beam and thermally deposited thin films samples at 200 °C substrate temperature. Electrical measurements recorded using two probes method showed the maximum value of current for CdTe thin films deposited by electron beam evaporation method at 200 °C substrate temperature.
关键词： Thermal vacuum evaporation,Optical properties,Thin films,Electron beam evaporation,Electrical properties,Structural properties,Substrate temperature,Cadmium telluride
更新于2025-09-09 09:28:46