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In-Situ process monitoring during laser transmission welding of PA6-GF30
摘要： Quasi-simultaneous laser transmission welding is preferably used for packaging sensors and electronics. In order to protect the components from moisture, a hermetic encapsulation is needed. However, local weld seam interruptions cannot be identified with the commonly used set-path monitoring. By using a pyrometer, coaxially integrated into a 3D-scanner, gaps between the joining partners can be allocated on basis of the measured temperature. However, the scattering of the heat radiation, especially caused by the fiber reinforcement of the plastics, leads to a reduction of the accessible heat radiation, which makes the identification of gaps considerably more difficult. The herein used experimental setup is characterized by a small detection spot and only by a slight weakening of the heat radiation inside the scanner. Hence, for welding PA6-GF30, the detection of small sized gaps is possible, even if a glass fiber content of 30 percent (wt.) and a weld seam width with approximately 1 mm are given.
关键词： in-situ monitoring,plastics welding,pyrometer,temperature measurement,fiber reinforced plastics
更新于2025-09-12 10:27:22
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Nanocavities cause a stir
摘要： Reactions between gases and liquids are important in industry but are typically slow and difficult to monitor in situ. Elevated temperatures and pressures are often required to increase the efficiency of reactions between immiscible gases and liquids. Now, reporting in Angewandte Chemie International Edition, Xing Yi Ling and colleagues introduce a platform composed of an array of solid nanoparticles coated in a metal–organic framework (MOF) that substantially increases gas–liquid reaction efficiency owing to the formation of interfacial nanocavities. The platform can also be adapted for the in situ monitoring of reactions.
关键词： nanocavities,gas–liquid reactions,metal–organic frameworks,in situ monitoring,solid@MOF
更新于2025-09-09 09:28:46
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Development of a scanning probe microscopy integrated atomic layer deposition system for <i>in situ</i> successive monitoring of thin film growth
摘要： A dual chamber system integrated with atomic layer deposition (ALD) and atomic force microscopy (AFM) was developed for the successive monitoring of nanoparticles to thin film growth process. The samples were fabricated in the ALD chamber. A magnetic transmission rod enabled sample transferring between the ALD and the AFM test chambers without breaking the vacuum, avoiding possible surface morphology change when frequently varying the growth condition and oxidation under ambient condition. The sample transmission also avoids deposition and contamination on the AFM tip during the successive testing. The sample stage has machined a group of accurate location pinholes, ensuring the 10 μm2 measurement consistency. As a demonstration, the platinum thin films with different thickness were fabricated by varying ALD cycles. The surface morphology was monitored successively during the deposition. Under vacuum with controlled oxygen partial pressure, the aging and sintering phenomenon of particles has been studied in the AFM testing chamber after high temperature treatment. The integrated AFM/ALD instrument is potentially a powerful system for monitoring the thin film preparation and characterization.
关键词： platinum thin films,atomic force microscopy,in situ monitoring,atomic layer deposition,thin film growth
更新于2025-09-04 15:30:14