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[IEEE 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - Vancouver, BC, Canada (2019.6.12-2019.6.14)] 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - A study on the lifetime estimation of photovoltaic modules under accelerated environmental conditions
摘要： Lifetime estimation is critical for predicting the revenue of the photovoltaic (PV) plant to be built. Therefore it must be done before huge investments will be made to build and operate a PV plant. Since the degradation rate of PV modules features as a random variable, statistical models are commonly used to estimate the lifetime of PV modules. However, most existing researches select the statistical model to describe the degradation rate of PV modules empirically, and lack of basis. In this paper we propose a practical procedure for selecting the statistical model which describes the degradation rate of PV modules best. Based on the selected model, the lifetime of PV modules is estimated. We use probability plots and hypothesis tests to validate the distributional assumptions. Then we use negative log-likelihood values to further determine the distribution that describes the lifetimes best. Three classical distributions, i.e., Weibull, lognormal and exponential distributions, are considered. The life distributions at different stress levels are assumed to come from the same parametric family. Based on the assumption, the parameters of the hypothesized distributions are estimated using maximum likelihood estimation methods. It is found that the PV lifetimes follow a parametric location-scale distribution family, and they follow the Weibull distribution best. The conclusion is realistic from a physical point of view.
关键词： accelerated tests,photovoltaic modules,statistical models,distribution determination,lifetime estimation
更新于2025-09-16 10:30:52
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[IEEE 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) - Toulouse, France (2019.8.27-2019.8.30)] 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) - Parametric degradation model of OLED using Design of Experiments (DoE)
摘要： This article presents an original parametric degradation model using Design of Experiments. This method is based on the estimation of a Weibull function under accelerated conditions. It is applied on cold white organic light emitting diodes OLEDs from Philips with a 10000 hrs theoretical lifetime. Accelerated degradation using thermal and electrical stress is tested. The predicted degrading model is a function of time, temperature, current density and their interaction. It illustrates the behaviour of the degradation of the OLED using multiple stress factors without really knowing the physics of these degradations. The proposed model is tested on experimental data for different luminances. The average error of the predicted model compared to real values is around 3 %. The proposed model is then compared to a previously developed lifespan model. The results obtained with the present approach are closer to the real values.
关键词： Degradation,Electrical stresses,Modeling,Thermal stresses,Design for Experiments,Accelerated aging,Organic light emitting diodes,Weibull distribution,Lifetime estimation
更新于2025-09-12 10:27:22
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[IEEE 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia) - Niigata (2018.5.20-2018.5.24)] 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) - The Lifetime Assessment of a Micro-Inverter for PV Applications
摘要： Recently, introducing grid-tied PV systems is recommended in many countries. The inverter lifetime in PV applications is affected by their operating conditions. That is affected by the thermal loading of the power devices lifetime of electrolytic capacitors. Especially, the electrolytic capacitors at the DC-link to compensate the power ripple decreases when the ambient temperature increases. To improve the lifetime, a micro-inverter with an active buffer at the DC-link is introduced in this paper. In this micro-inverter, the DC-link electrolytic capacitor is replaced with a ceramic capacitor that has small capacitance. However, the reliability performance of the entire micro-inverter has not been evaluated. This paper thus assesses the lifetime of the micro-inverter considering the operational conditions (i.e., ambient temperature and solar irradiance, also referred to as mission profiles). A comparison between the proposed circuit with an active buffer and the conventional circuit based on a boost chopper is performed in this paper. It is revealed that the lifetime of the micro-inverter is very long. This is due to the over-designed power devices.
关键词： Photovoltaic,Lifetime estimation,Micro inverter
更新于2025-09-04 15:30:14