- 标题
- 摘要
- 关键词
- 实验方案
- 产品
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Research of Single-Event Burnout and Hardening of AlGaN/GaN-Based MISFET
摘要： This brief ?rst time presents single-event burnout (SEB) simulation results for conventional AlGaN/GaN gate ?eld plate MISFET (GFP-C MISFET), simultaneously, a hardened MISFET with electrode connected doped plugs in the buffer (EC-DP MISFET) is proposed for the ?rst time. The SEB triggering mechanisms contain the back-channel effect and following impact ionization dominated by electron in the high ?eld region. By comparing the simulation results from the GFP-C MISFET and proposed hardened EC-DP MISFET, the carriers induced by heavy ion can be quickly absorbed to drain and source electrode through EC-DP, so that the proposed EC-DP MISFET can achieve better SEB performance than conventional one. With a heavy ion having the linear energy transfer value of 0.6-pC/μm striking vertically, SEB threshold voltage obtained in GFP-C MISFET and hardened EC-DP MISFET is 280 and 338 V, respectively.
关键词： MISFET,single-event burnout (SEB) hardening,SEB,technology computer-aided design (TCAD),Electrode connected doped plugs (EC-DP)
更新于2025-09-23 15:23:52
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[IEEE 2018 41st International Conference on Telecommunications and Signal Processing (TSP) - Athens, Greece (2018.7.4-2018.7.6)] 2018 41st International Conference on Telecommunications and Signal Processing (TSP) - Studying an Optimal Approach to Design Combined Fiber-Wireless Telecom Systems
摘要： We proposed a new approach to design interface hardware for next-generation telecom systems of combined fiber-wireless architecture based on nonlinear behavioral modeling in widespread off-the-shelf CAD tool NI AWRDE. To validate the approach, we research in detail a prospective base station operating in EU-assigned band (3.4-3.8 GHz) of 5G networks, which has easy-to-configure layout using the same cost- and power-efficient LW-VCSEL in downlink and uplink channels and direct modulation of LW-VCSEL in period-doubling state.
关键词： fronthaul fiber-wireless architecture,vertical cavity surface-emitting laser,base station,fifth-generation telecom network,computer-aided design
更新于2025-09-23 15:22:29
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[IEEE NAECON 2019 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2019.7.15-2019.7.19)] 2019 IEEE National Aerospace and Electronics Conference (NAECON) - In Situ Process Monitoring for Laser-Powder Bed Fusion using Convolutional Neural Networks and Infrared Tomography
摘要： Additive Manufacturing (AM) is a growing field for various industries of avionics, biomedical, automotive and manufacturing. The onset of Laser Powder Bed Fusion (LPBF) technologies for metal printing has shown exceptional growth in the past 15 years. Quality of parts for LPBF is a concern for the industry, as many parts produced are high risk, such as biomedical implants. To address these needs, a LPBF machine was designed with in-situ sensors to monitor the build process. Image processing and machine learning algorithms provide an efficient means to take bulk data and assess part quality, validating specific internal geometries and build defects. This research will analyze infrared (IR) images from a Selective Laser Melting (SLM) machine using a Computer Aided Design (CAD) designed part, featuring specific geometries (squares, circles, and triangles) of varying sizes (0.75-3.5 mm) on multiple layers for feature detection. Applying image processing to denoise, then Principal Component Analysis (PCA) for further denoising and applying Convolution Neural Networks (CNN) to identify the features and identifying a class which does not belong to a dataset, where a dataset are created from CAD images. Through this automated process, 300 geometric elements detected, classified, and validated against the build file through CNN. In addition, several build anomalies were detected and saved for end-user inspection.
关键词： Laser Powder Bed Fusion (LPBF),Principal Component Analysis (PCA),infrared image (IR),Convolution Neural Networks (CNN),Additive Manufacturing (AM),Computer Aided Design (CAD)
更新于2025-09-23 15:21:01
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The application of image analysis technology in the extraction of human body feature parameters
摘要： With the improvement of living standards, personalized clothing customization has become a trend of people’s apparel demand. The key factor in personalized clothing customization is a three-dimensional human modeling. With the development of image analysis technology, it is possible to use image analysis technology to extract human characteristics. In this paper, two-dimensional human feature regions and characteristic parameter extraction methods of images are used. The backpropagation neural network (BP neural network) is used to curve the three-dimensional human characteristics, and the neck, chest, waist, and buttocks of 22 subjects are verified. The results show that the use of this method can well achieve the extraction of human characteristic parameters.
关键词： Human characteristics,BP neural network,Image analysis,Feature extraction,Computer-aided design (CAD)
更新于2025-09-23 15:21:01
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[IEEE 2019 6th International Conference on Systems and Informatics (ICSAI) - Shanghai, China (2019.11.2-2019.11.4)] 2019 6th International Conference on Systems and Informatics (ICSAI) - An electromagnetic and piezoelectric coupled energy harvester using cantilever beam for low frequency vibration
摘要： With the emergence of the Microsoft Kinect sensor, many developer communities and research groups have found countless uses and have already published a wide variety of papers that utilize the raw depth images for their specific goals. New methods and applications that use the device generally require an appropriately large ensemble of data sets with accompanying ground truth for testing purposes, as well as accurate models that account for the various systematic and stochastic contributors to Kinect errors. Current error models, however, overlook the intermediate infrared (IR) images that directly contribute to noisy depth estimates. We, therefore, propose a high fidelity Kinect IR and depth image predictor and simulator that models the physics of the transmitter/receiver system, unique IR dot pattern, disparity/depth processing technology, and random intensity speckle and IR noise in the detectors. The model accounts for important characteristics of Kinect’s stereo triangulation system, including depth shadowing, IR dot splitting, spreading, and occlusions, correlation-based disparity estimation between windows of measured and reference IR images, and subpixel refinement. Results show that the simulator accurately produces axial depth error from imaged flat surfaces with various tilt angles, as well as the bias and standard lateral error of an object’s horizontal and vertical edge.
关键词： simulation,Computer-aided design (CAD),Microsoft Kinect,infrared (IR) dot pattern,structured-light 3-D scanner,speckle noise
更新于2025-09-23 15:19:57
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[ACM Press SIGGRAPH Asia 2017 Posters - Bangkok, Thailand (2017.11.27-2017.11.30)] SIGGRAPH Asia 2017 Posters on - SA '17 - VR lighting design
摘要： Lighting design is a crucial process in video games, animation, interior design, and some other fields. Current lighting design systems support only direct lighting paradigm which requires fine-tuning each light’s parameters to achieve a global lighting effect. In this study, we developed an integrated lighting design system which comprises direct, indirect, and inverse lighting design paradigms in VR environment. The system provides designers with an immersive, intuitive, and effective way of lighting design.
关键词： Lighting design,Computer-aided design,Virtual reality,VR,Inverse lighting
更新于2025-09-19 17:15:36
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SiQAD: A Design and Simulation Tool for Atomic Silicon Quantum Dot Circuits
摘要： This paper introduces SiQAD, a computer-aided design tool enabling the rapid design and simulation of computational assemblies of atomic silicon quantum dots. SiQAD consists of several simulation tools: a ground state electron configuration finder, a non-equilibrium electron dynamics simulator, and an electric potential landscape solver for the exploration of field-driven modulation with electrodes. Simulations have been compared against past experimental results to inform the electron population estimation and dynamic behavior. Fundamental logic building blocks and circuits suitable for this platform have been designed and simulated, and a clocked wire has been demonstrated. This work paves the way and provides the first set of open design tools for the exploration of the emerging design space of atomic silicon quantum dot circuits.
关键词： simulation,Computer aided design,silicon dangling bonds,SiQAD,quantum dots
更新于2025-09-19 17:13:59
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[IEEE 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Chicago, IL, USA (2019.6.16-2019.6.21)] 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) - Integration of Photovoltaic Systems into Smart Grids Demonstration of Solar-, Storage and E-Mobility Applications within a Secure Energy Information Network in Germany
摘要： With the emergence of the Microsoft Kinect sensor, many developer communities and research groups have found countless uses and have already published a wide variety of papers that utilize the raw depth images for their specific goals. New methods and applications that use the device generally require an appropriately large ensemble of data sets with accompanying ground truth for testing purposes, as well as accurate models that account for the various systematic and stochastic contributors to Kinect errors. Current error models, however, overlook the intermediate infrared (IR) images that directly contribute to noisy depth estimates. We, therefore, propose a high fidelity Kinect IR and depth image predictor and simulator that models the physics of the transmitter/receiver system, unique IR dot pattern, disparity/depth processing technology, and random intensity speckle and IR noise in the detectors. The model accounts for important characteristics of Kinect’s stereo triangulation system, including depth shadowing, IR dot splitting, spreading, and occlusions, correlation-based disparity estimation between windows of measured and reference IR images, and subpixel refinement. Results show that the simulator accurately produces axial depth error from imaged flat surfaces with various tilt angles, as well as the bias and standard lateral error of an object’s horizontal and vertical edge.
关键词： simulation,Computer-aided design (CAD),Microsoft Kinect,infrared (IR) dot pattern,structured-light 3-D scanner,speckle noise
更新于2025-09-19 17:13:59
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Computer-Aided Laser-Fiber Output Beam 3D Spatial and Angular Design
摘要： Multiple laser beams and single-mode optical fibers output can be approximated by assuming that the emitted light has a symmetrical Gaussian intensity profile, which corresponds to the transverse electromagnetic mode (TEM00), which is designated as a Gaussian beam. Current free-accessible design tools are limited to the spatial analysis of the beams, in general, and to the intensity, in particular, and to the graphical visualization in 2D with very limited options. In this work, a novel a computer-aided laser-fiber output beam TEM00 designer, CATEM00, is presented based on the 3D representations typically provided by camera beam profilers, and on the fundamentals of the wave theory of light, including diverse flexibility capabilities for graphical manipulation and parameter comprehension both in terms of spatial behavior and in angular confinement. It must be highlighted that not only is the spatial limitation design of light impact relevant in TEM00 applications but, also, the angle with which the light reaches the target. Hence, the availability of capabilities of phase design in TEM00 following the paraxial limitations is highly convenient. Results and discussion in terms of intensity, power, divergence and wave fronts are presented considering a set of study cases, showing its coherence with Gaussian beam theory.
关键词： simulation,software tool,computer-aided design,optical fiber,symmetric and directional beam light
更新于2025-09-16 10:30:52
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[IEEE 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) - Munich, Germany (2019.6.23-2019.6.27)] 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) - Plug-and-Play Generation and Manipulation of Squeezing on Chip
摘要： We propose a novel graphic method to enable the analysis of the field-effect transistor (FET) threshold voltage variation (cid:2)Vth due to random telegraph signals in a percolative channel. First, through technology computer-aided design simulation with no percolation, both a minimum (cid:2)Vth and a critical curve in a mloc ? σloc plot are produced. The former constitutes a statistical distribution far away from the conventional log-normal one. In the latter, mloc and σloc are the mean and the standard deviation, respectively, of a well-known normal variable in Mueller–Schulz’s percolation theory. The critical mloc ? σloc curve divides the plot into the allowed region and the forbidden region and will go down with increasing gate size. Then, (cid:2)Vth contours in the allowed region are graphically created. While applying to existing experimental (cid:2)Vth statistical distributions of SiON- and high-k metal gate (HKMG)-scaled FETs, resulting paired mloc and σloc at high (cid:2)Vth remain intact, regardless of gate size or gate stack type. This means that the underlying percolation patterns resemble each other, due to the same manufacturing process used. However, if these paired mloc and σloc fall in the forbidden region, it is the critical mloc ? σloc curve dominating. Application to bias and temperature instability statistical data in literature is straightforwardly well done.
关键词： percolation,technology computer-aided design (TCAD),Bias and temperature instability (BTI),trap,random telegraph signals (RTSs),field-effect transistors (FETs)
更新于2025-09-16 10:30:52