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Sharp phase-separated interface of 6,13-bis(triisopropylsilylethynyl) pentacene/polystyrene blend films prepared by electrostatic spray deposition
摘要： In this study, organic field-effect transistors (OFETs) based on blend films comprising 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS pentacene) and polystyrene (PS) were fabricated. The blend films were prepared by electrostatic spray deposition (ESD). A vertically phase-separated structure (TIPS pentacene (top)/PS (bottom)) can be spontaneously formed without additional treatments such as solvent-vapor annealing, which is significantly different from the blend with poly(methyl methacrylate) (PMMA). Due to the sharp phase-separated interface, OFETs based on the TIPS pentacene/PS blend films exhibited superior characteristics and operational stability.
关键词： Organic field-effect transistor,Small molecule/polymer blend,Electrostatic spray deposition,Vertical phase separation
更新于2025-09-23 15:22:29
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The 0D Cs2TeI6 Perovskite: Solution Processed Thick Films with High X-Ray Sensitivity
摘要： We demonstrate a potential candidate the 0-D “all-inorganic” perovskite material Cs2TeI6 as a sensitive all-inorganic X-ray photoconductor for the development of the new generation of direct photon-to-current conversion flat panel X-Ray imagers. Cs2TeI6 consists of high atomic number elements, has high electrical resistance and exhibits high air and moisture stability making it suitable as a sensitive X-ray photoconductor. In addition, we identify that Cs2TeI6 film can be prepared under low temperature process using electrostatic assisted spray technique at atmospheric condition and achieved the resistivity of 4.2×1010 Ω·cm. The resulting air and water-stable Cs2TeI6 device exhibits strong photoresponse to X-ray radiation. An electron drift length on the order of 200 μm is estimated under an applied electrical field strength of 400 V·cm-1. A high sensitivity for Cs2TeI6 thick film device is realized, with the value of 192 nC·R-1cm-2 under 40 kVp X-rays at an electrical field of 250 V·cm-1, which is about 20 times higher than that of the hybrid 3D perovskite polycrystalline film X-ray detectors. X-ray imaging based on Cs2TeI6 perovskite films will require lower radiation doses in many medical and security check applications.
关键词： hard radiation,sensitivity,thick film,perovskite,Cs2TeI6,electrostatic spray
更新于2025-09-04 15:30:14