研究目的
Investigating the effect of thionation on the performance of PNDIT2-based polymer solar cells.
研究成果
Thionation of the high performance acceptor polymer PNDIT2 results in a systematic reduction in both the VOC and JSC with thionation. This deterioration is attributed to the lower mobility of the thionated polymers and differences in morphology and molecular packing. Thionation disrupts π-π stacking, with the thionated blends showing reduced crystalline order of the acceptor phase, linked to significantly lower electron mobilities.
研究不足
Due to synthetic limitations, samples with 100% conversion to 2S-trans configuration could not be produced. The thionated polymers exhibited a systematic lowering of photovoltaic parameters with increasing thionation, resulting in lower device efficiencies.
1:Experimental Design and Method Selection:
Solar cells were fabricated with the original polymer, PNDIT2, as a reference, and an optimized efficiency of
2:85% was achieved. Batches with increasing ratios of 1S to 2S-trans thionation (
85, 7:93, and 5:95) were studied.
3:Sample Selection and Data Sources:
The donor polymer, PTB7-Th, was purchased from 1-Material and used as received. The reference acceptor polymer, PNDIT2, was purchased from Raynergy Tek and used as received. Three samples of the thionated analog to PNDIT2 were used.
4:List of Experimental Equipment and Materials:
Solar cells were fabricated using a 1:1 weight ratio of donor to acceptor using chlorobenzene as the solvent. The following inverted device architecture led to the highest performing solar cells: ITO/PEIE/Active Layer/MoOx/Ag.
5:Experimental Procedures and Operational Workflow:
All active layers were deposited at 6000 RPM, resulting in active layer thicknesses of 118 nm for PNDIT2 devices and ~105 nm for 2S-trans-PNDIT2-based devices. Following active layer deposition, 12 nm of MoOx (
6:3 ?/s) and 100 nm of Ag (1 ?/s) were vacuum deposited below 9 × 10?7 torr using an Angstrom Engineering Covap evaporator. Data Analysis Methods:
Current-voltage (J-V) characteristics for all devices were measured using a Keithley 2635 source meter. A Photo Emission Tech model SS50AAA solar simulator, simulating an AM1.5 G radiation spectrum with 100 mW/cm2 irradiance was used.
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Agilent 33522A
33522A
Agilent
Function generator powering the LED
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Keithley 2635 source meter
2635
Keithley
Measuring current-voltage (J-V) characteristics for all devices
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Perkin Elmer Lambda 1050 Spectrometer
1050
Perkin Elmer
UV-visible-NIR absorption measurement
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Bruker Dimension Icon
Dimension Icon
Bruker
Obtaining AFM images
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JEOL JEM-2100F TEM
JEM-2100F
JEOL
Obtaining TEM images
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Ocean Optics spectrometer
FLAME-S-VIS-NIR-ES
Ocean Optics
Obtaining photoluminescence spectra
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Agilent DSOX3032A
DSOX3032A
Agilent
Digital oscilloscope for recording transient photocurrent measurements
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Photo Emission Tech model SS50AAA solar simulator
SS50AAA
Photo Emission Tech
Simulating an AM1.5 G radiation spectrum with 100 mW/cm2 irradiance
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Oriel Cornerstone 130 monochromator
130
Oriel
Dispersing light from a tungsten filament
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Riken Kekei AC-2 spectrometer
AC-2
Riken Kekei
Photoelectron spectroscopy in air (PESA) measurements
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Gatan UltraScan 1000 (2k×2k) CCD camera
UltraScan 1000
Gatan
Collecting defocussed bright-field images
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Horiba Quanta-phi
Quanta-phi
Horiba
Integrating sphere coupled to the Ocean Optics spectrometer
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Thorlabs
L-7104VGC-H
Kingbright
525 nm LED for excitation
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