研究目的
Investigating the growth and optical properties of crystallographically oriented porous ZnO nanostructures for visible-blind UV photodetection.
研究成果
The study successfully demonstrated the catalyst-free growth of highly crystalline and porous ZnO nanostructures using a two-stage PLD method. The seeding-angle was found to be a critical parameter influencing the crystallographic orientation, porosity, and optical properties of the nanostructures. The results suggest potential applications in visible-blind UV photodetection.
研究不足
The study focuses on the influence of seeding-angle on the properties of ZnO nanostructures but does not explore the effects of other deposition parameters such as temperature or pressure variations.
1:Experimental Design and Method Selection:
The study used a two-stage pulsed laser deposition (PLD) method to grow ZnO nanostructures. The first stage involved varying the seeding-angle for self-seeding on quartz substrates, and the second stage involved growing nanostructures at a fixed glancing angle.
2:Sample Selection and Data Sources:
High purity ZnO powder was used to make pellets for PLD. Quartz substrates were prepared by sonication before deposition.
3:List of Experimental Equipment and Materials:
Pulsed KrF excimer laser source, Rigaku SmartLab X-ray diffractometer, FESEM (Supra55 Zeiss), ImageJ software, Keithley meter, LabRam HR Evolution spectrometer, UV-Vis spectrometer (carry 60, Agilent), Dongwoo optron DM 500i PL spectrometer.
4:Experimental Procedures and Operational Workflow:
The deposition was performed in two stages with varying seeding-angles in the first stage and a fixed glancing angle in the second stage. The samples were characterized using XRD, SEM, Raman spectroscopy, UV-Vis spectroscopy, and PL spectroscopy.
5:Data Analysis Methods:
The crystallite size was calculated using the Scherrer equation. Porosity was analyzed using ImageJ software. Optical band gap was calculated using Tauc plots.
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Field Emission Scanning Electron Microscope
Supra55
Zeiss
Observation of surface morphology
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UV-Vis spectrometer
carry 60
Agilent
Measurement of optical absorption spectra
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Pulsed KrF excimer laser source
Compex Pro 102 F
Ablation of ZnO target
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X-ray diffractometer
Rigaku SmartLab
Characterization of crystalline structure
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PL spectrometer
DM 500i
Dongwoo optron
Room temperature Photoluminescence spectroscopy
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