研究目的
To present a plasma display device (PDD) based on laser-induced graphene nanoribbons (LIGNs) with superior field electron emission (FEE) characteristics and excellent plasma illumination performance.
研究成果
LIGNs exhibit superior FEE characteristics and excellent plasma illumination performance, making them promising candidates for high-brightness display devices. The direct laser-patternability of LIGNs offers a significant advantage for display technology applications.
研究不足
The study does not address the scalability of the LIGN fabrication process for industrial production or the long-term durability of LIGN-based PDDs under continuous operation.
1：Experimental Design and Method Selection:
Laser induction on polyimide sheets was performed using a pulsed CO2 laser system to obtain LIGNs. The FEE and plasma illumination characteristics were measured.
2：Sample Selection and Data Sources:
Polyimide sheets were used as substrates for LIGNs.
3：List of Experimental Equipment and Materials:
Universal Laser Systems VLS
4：30, polyimide sheets, FESEM, TEM, Raman spectroscopy, X-ray photoelectron spectroscopy, XRD, Keithley 6517B electrometer, Keithley 2410 electrometer. Experimental Procedures and Operational Workflow:
LIGNs were characterized using various techniques, and their FEE and plasma illumination properties were measured.
5：Data Analysis Methods:
The FEE characteristics were analyzed using Fowler–Nordheim theory.
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Universal Laser Systems VLS2.30
VLS2.30
Universal Laser Systems
Laser induction on polyimide sheets to obtain LIGNs.
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TEM
Jeol 2011
Jeol Taiwan Semiconductors Limited
Characterization of LIGNs.
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XRD
Bruker D8-discover diffractometer
Bruker
Characterization of LIGNs.
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Keithley 6517B electrometer
6517B
Keithley Instruments, Inc.
Measurement of current–voltage characteristics.
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Keithley 2410 electrometer
2410
Keithley Instruments, Inc.
Measurement of plasma current density.
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DC pulsed voltage
HPP-20KA01KAT B
Delta Electronics Inc.
Ignition of plasma.
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Polyimide sheets
IM301450
Goodfellow
Substrates for LIGNs.
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FESEM
SU5000
Hitachi High-Technologies Corporation
Characterization of LIGNs.
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Raman spectroscopy
Renishaw confocal microscope
Renishaw
Characterization of LIGNs.
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X-ray photoelectron spectroscopy
PHI 6000
Physical Electronics
Characterization of LIGNs.
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