研究目的
To design a novel ambient-air sulfurization process for fabricating Cu2ZnSnS4 (CZTS) absorber thin films, aiming to eliminate the requirement of complex vacuum equipment and simplify the sulfurization process.
研究成果
The ambient-air sulfurization process successfully produced CZTS thin films with pure Kesterite phase, large grains, and a suitable band gap, leading to a solar cell efficiency of 3.01%. The method offers a simplified and scalable approach to sulfurization, applicable to other absorber materials.
研究不足
The study identifies the need for optimization in the electrical properties of CZTS thin films and P-N junction to enhance device performance further.
1:Experimental Design and Method Selection:
The study involved the synthesis of CZTS thin films through an ambient-air sulfurization process, where sulfur powder and oxide precursor films were enclosed in a quartz container to self-create an inert atmosphere during annealing.
2:Sample Selection and Data Sources:
Metal salts were used to prepare oxide nanoparticle ink, which was then coated on molybdenum-coated soda-lime glass to form precursor films.
3:List of Experimental Equipment and Materials:
Quartz ampoules, tube furnace or muffle furnace, X-ray diffraction (XRD), Raman measurement, field emission scanning electron microscope (FESEM), Energy Dispersive X-ray Spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS), UV-visible spectrophotometer, Keithley 4200-SCS for J-V and C-V measurements, and a solar simulator for EQE measurements.
4:Experimental Procedures and Operational Workflow:
The precursor films were sulfurized in quartz ampoules with varying amounts of sulfur powder under ambient-air conditions, followed by characterization and device fabrication.
5:Data Analysis Methods:
The crystallinity, morphology, composition, and optoelectronic properties of the films were analyzed using XRD, Raman spectroscopy, SEM, EDX, XPS, and UV-Vis spectroscopy. Device performance was evaluated through J-V, C-V, and EQE measurements.
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X-ray photoelectron spectroscopy
K-Alpha
Thermo Fisher Scientific
Study the chemical nature of CZTS thin films
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UV-visible spectrophotometer
UV-2450
Shimadzu
Test the transmission spectrum of the CZTS thin film
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Keithley 4200-SCS
4200-SCS
Keithley
Measurement of current density-voltage (J-V) and capacitance-voltage (C-V) characteristics
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X-ray diffraction
D/Max-rA
Not provided
Characterization of the structure and phase properties of the thin film
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Raman measurement
LABRAM-HR
Not provided
Characterization of the phase properties of the thin film
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Field emission scanning electron microscope
SU-8010
Not provided
Characterization of the morphology and the composition of the film
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Solar simulator
AAA SAN-EI Electric
SAN-EI Electric
Simulation of solar illumination for device testing
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Solar cell QE measurement system
QEX10
PV MEASUREMENTS
Measurement of external quantum efficiency (EQE) of the device
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