研究目的
Investigating the method to acquire near-infrared emission from normal red-emitting materials through tuning the thickness of the emissive layer with an inverted device structure.
研究成果
The study successfully demonstrated a method to acquire near-infrared emission from normal red-emitting materials through tuning the thickness of the emissive layer with an inverted device structure, achieving significant red-shift in emission spectra and reasonable external quantum efficiencies.
研究不足
The study is limited by the specific materials used (PF-FSO10, PPF-FSO15-DHTBT10, and MEH-PPV) and the inverted device structure, which may not be universally applicable to all polymer light-emitting materials.
1：Experimental Design and Method Selection:
The study utilized an inverted device structure to investigate micro-cavity effects on the emission spectra of polymer light-emitting diodes.
2：Sample Selection and Data Sources:
The emissive layers were prepared using PF-FSO10 and PPF-FSO15-DHTBT10 blend, and MEH-PPV.
3：List of Experimental Equipment and Materials:
Instruments included a Tencor Alpha-step 500 Surface Profilometer, Keithley 236 source-measurement unit, PR-705 Spectrascan spectrophotometer, SHIMADZU UV-2600 spectrophotometer, and HORIBA scientific fluoromax-4 spectro-fluorometer.
4：Experimental Procedures and Operational Workflow:
Devices were fabricated with varying thicknesses of the emissive layer, and their performance was measured under controlled conditions.
5：Data Analysis Methods:
Optical simulation of EL spectra was carried out with OLED optics simulation software (ExpertOLED).
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Keithley 236 source-measurement unit
236
Keithley
Measuring the current density-luminance-voltage characteristics
-
SHIMADZU UV-2600 spectrophotometer
UV-2600
SHIMADZU
Recording UV-vis absorption spectra
-
HORIBA scientific fluoromax-4 spectro-fluorometer
fluoromax-4
HORIBA scientific
Recording photoluminescence spectra
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Tencor Alpha-step 500 Surface Profilometer
Alpha-step 500
Tencor
Determining the thicknesses of solution processed film
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PR-705 Spectrascan spectrophotometer
PR-705
Photo Research
Recording the electroluminescence spectra and CIE color coordinates
-
Integrating Sphere IS080
IS080
LabSphere
Measuring the PL quantum yields
-
OLED optics simulation software
ExpertOLED
Optical simulation of EL spectra
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