研究目的
Investigating the optical constants, mass densities, thermo optic coefficients, electronic polarizability coefficients, and the coefficients of temperature dependence of density of vacuum evaporated MoO3 thin films and of ZxMoO3 (Z = H+, Li+) bronze thin films annealed at different temperatures and within an oxygen plasma environment.
研究成果
The investigated ellipsometric data is interpreted in terms of polaronic excitations and hopping mechanism testifying that the structure of molybdenum bronzes are least affected during any annealing run in the investigated temperature range. These new findings of temperature dependent density measurements, thermo-optical coefficients (TOCs) and electronic polarizability coefficients of molybdenum bronzes are very important parameters for smart windows, high power fibre lasers, microelectronics, optoelectronics, and in the integrated optics.
研究不足
The films remain microcrystalline when annealed at 453 K without or under oxygen plasma. The optical band gap energy depends on the density, porosity, and temperature and it becomes smaller at higher temperature for amorphous or microcrystalline thin films.
1：Experimental Design and Method Selection:
Manual ellipsometry was used to measure the optical constants (n, k) of the films. The ellipsometric parameters, ψ and Δ, were measured by the ratio ρ of the complex Fresnel reflection coefficients Rp and Rs.
2：Sample Selection and Data Sources:
MoO3 thin films and ZxMoO3 (Z = H+, Li+) bronze thin films were prepared by thermal co-evaporation technique and atomic hydrogen plasma initiated by microwave generator, respectively.
3：List of Experimental Equipment and Materials:
A manual single wavelength ellipsometer in the PCSA Configuration, 7059 glass substrates, MoO3 powder, Li metal pellets, and a vacuum cryostat.
4：Experimental Procedures and Operational Workflow:
Films were annealed at different temperatures over the range 298–453 K without and within an oxygen plasma environment. The thickness of each film was measured before each ellipsometric annealing run.
5：Data Analysis Methods:
The complex refractive index of each sample was computed from the experimentally measured ellipsometric parameters, ψ and Δ. The film density was calculated from refractive index data using a well-known expression.
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