研究目的
To explore the performance of SnS-based TFSCs with a ZnxCd1-xS buffer layer deposited by the SILAR method and investigate their effect on device performance.
研究成果
The study demonstrates the potential of SILAR-deposited ZnxCd1-xS buffer layers for SnS-based TFSCs, achieving a record Voc of 0.405 V and a PCE of 3.72%. The optimal band alignment and minimized interfacial recombination at the SnS/Zn0.34Cd0.66S interface contribute to the improved device performance. Further optimization of the buffer layer's electrical properties could enhance the PCE.
研究不足
The relatively poor fill factor (FF) due to the high series resistance of the Zn0.34Cd0.66S buffer layer limits further improvement in the power conversion efficiency (PCE). Additional doping or annealing treatments may be required to modulate the electrical properties of the buffer layers.
1:Experimental Design and Method Selection:
The SnS absorber layer was grown on an ~1-μm-thick Mo/soda-lime glass (SLG/Mo) substrate using the vapor transport deposition (VTD) method. The ZnxCd1-xS buffer layers were deposited using the successive ionic layer adsorption and reaction (SILAR) method.
2:Sample Selection and Data Sources:
SnS granules (i-Tasco,
3:999%) were used as the source for SnS film deposition. The ZnxCd1-xS buffer layers were deposited on fluorine-doped tin oxide (FTO) and SLG/Mo/SnS substrates. List of Experimental Equipment and Materials:
A one-zone furnace (S&R Korea, SRDVF-LV-3B-1608) for SnS deposition, SILAR deposition unit (Opto-Mechatronic Pvt. Ltd., HOLMARC) for buffer layer deposition, and various chemicals including cadmium acetate, zinc acetate, and sodium sulfide.
4:Experimental Procedures and Operational Workflow:
Sequential steps of substrate immersion into cationic and anionic precursors were performed for the SILAR deposition. The thickness and composition of the ZnxCd1-xS films were controlled by varying the deposition cycles and the Zn-to-Cd ratio.
5:Data Analysis Methods:
UV-Vis spectrophotometry, SEM, XRF, XPS, and temperature-dependent Voc analysis were used to characterize the materials and devices.
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UV-Vis-near-IR spectrophotometer
Cary 500
Agilent
Optical transmission spectra measurement
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SEM
JSM7500F
Jeol
Morphology and thickness investigation
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Spectral response measurement system
CEP25BX
Jasco
External quantum efficiencies determination
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XPS
AXIS-Nova Ultra DLD
Kratos
Band structure estimation
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SnS granules
i-Tasco
Source for SnS film deposition
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One-zone furnace
SRDVF-LV-3B-1608
S&R Korea
SnS film deposition
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SILAR deposition unit
Opto-Mechatronic Pvt. Ltd., HOLMARC
Buffer layer deposition
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Cadmium acetate
Sigma Aldrich
Cationic precursor for SILAR deposition
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Zinc acetate
Sigma Aldrich
Cationic precursor for SILAR deposition
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Sodium sulfide
Sigma Aldrich
Anionic precursor for SILAR deposition
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XRF
Thermo Fisher Scientific Inc.
Compositional analysis
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Solar simulator
XES-301S
San-ei Electric
Standard 1-sun illumination generation
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Keithley 2400
Current density–voltage characteristics measurement
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HP 4155B Semiconductor Parameter Analyzer
Dark J–V characteristics measurement
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