研究目的
Improving the efficiency of silicon solar cells using in situ fabricated perovskite quantum dots as luminescence downshifting materials.
研究成果
The in situ fabricated PQDCFs as LDS layers demonstrated excellent optical properties, leading to an absolute value of about 1% improvement in PCE for commercial silicon solar cells. Theoretical simulations supported the experimental results, indicating a high potential for further application in photovoltaic device optimization.
研究不足
The study focuses on the enhancement of UV-blue spectral response and does not address the potential degradation of the LDS layer over long-term exposure to environmental factors.
1:Experimental Design and Method Selection:
The study employed an in situ fabricated CH3NH3PbBr3 quantum dot/polyacrylonitrile (PAN) composite film as the LDS layer to enhance the UV-blue spectral response of silicon solar cells.
2:Sample Selection and Data Sources:
Commercial silicon solar cells were used, with the LDS layer applied via spin coating.
3:List of Experimental Equipment and Materials:
UV-6100 UV-vis spectrophotometer, F-380 fluorescence spectrometer, fluorescence spectrometer with an integrating sphere (C9920-02, Hamamatsu Photonics), fluorescence lifetime measurement system (C11367-11, Hamamatsu Photonics), Ambios XP-200 surface profiler, ellipsometer (M-2000D), JEOL-JEM 2100F transmission electron microscope, Bruker D8 FOCUS X-ray diffractometer, Thermo Fisher Scientific Nicolet 8700 spectrometer, PHI QUANTERA-II SXM X-ray photoelectron spectrometer.
4:Experimental Procedures and Operational Workflow:
The precursor solution was spin-coated onto the surface of quartz substrates and PV devices, forming a transparent layer. The thickness of the PQDCFs was controlled by varying the spinning speed.
5:Data Analysis Methods:
UV-vis transmittance spectra, PL spectra, absolute PLQYs, time-resolved PL measurements, thickness and refractive index measurements, TEM analysis, XRD measurements, FTIR measurements, XPS measurements.
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fluorescence spectrometer with an integrating sphere
C9920-02
Hamamatsu Photonics
Determining the absolute PLQYs of PQDCFs
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fluorescence lifetime measurement system
C11367-11
Hamamatsu Photonics
Time-resolved PL measurements
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transmission electron microscope
JEOL-JEM 2100F
JEOL
Analyzing ultrathin section samples
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X-ray diffractometer
Bruker D8 FOCUS
Bruker
XRD measurements
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spectrometer
Thermo Fisher Scientific Nicolet 8700
Thermo Fisher Scientific
FTIR measurements
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UV-6100 UV-vis spectrophotometer
UV-6100
Shanghai Mapada Instruments Co., Ltd.
Measuring UV-vis transmittance spectra of the PQDCFs
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F-380 fluorescence spectrometer
F-380
Tianjin Gangdong Sci. & Tech. Development Co., Ltd.
Recording PL spectra
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surface profiler
Ambios XP-200
Measuring the thickness of PQDCFs
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ellipsometer
M-2000D
Measuring the refractive index of PQDCFs
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X-ray photoelectron spectrometer
PHI QUANTERA-II SXM
PHI
XPS measurements
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