研究目的
Investigating the spontaneous enhancement of the power conversion efficiency in perovskite solar cells after storage in the dark.
研究成果
The spontaneous enhancement of PCE in PSCs is a general phenomenon not restricted to specific compositions or architectures. It is primarily due to reduced trap-assisted non-radiative recombination, possibly from strain relaxation. This enhancement is crucial for developing high-efficiency PSCs.
研究不足
The study is limited to multi-cation-halide PSCs and does not explore all possible perovskite compositions or device architectures. The exact mechanism behind the spontaneous enhancement is not fully understood.
1:Experimental Design and Method Selection:
The study investigates the spontaneous enhancement of PCE in PSCs with different perovskite compositions and architectures. Time-resolved photoluminescence, thermally stimulated current technique, and X-ray diffraction analyses are employed.
2:Sample Selection and Data Sources:
PSCs with various compositions and architectures are fabricated and stored in dark. Data is collected over days to observe changes in PCE and other parameters.
3:List of Experimental Equipment and Materials:
Solar simulator (Newport Oriel Sol3A), sourcemeter (Keithley 2400), scanning electron microscope (Zeiss LEO1530), AFM (Bruker Dimension Icon), X-ray diffraction system (Bruker D2Phaser), time-resolved PL spectroscopy setup.
4:Experimental Procedures and Operational Workflow:
PSCs are fabricated and stored in dark. J-V characteristics, PL spectra, TSC measurements, and XRD analyses are performed at intervals.
5:Data Analysis Methods:
Ideality factor is calculated from light-intensity-dependent VOC measurements. PL spectra are analyzed for changes in emission peaks. TSC data is analyzed for trap states. XRD data is analyzed for lattice strain.
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Sourcemeter
Keithley 2400
Keithley
Measuring the current-density – voltage (J–V) characteristics of the PSCs.
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Scanning electron microscope
Zeiss LEO1530
Zeiss
Obtaining high-resolution field emission cross-sectional scanning electron microscopy (SEM) images of perovskite thin films.
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AFM
Bruker Dimension Icon
Bruker
Atomic force microscopy analyses on perovskite thin films.
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X-ray diffraction system
Bruker D2Phaser
Bruker
Determining the crystallite structure of perovskite thin films.
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Time-resolved PL spectroscopy setup
Hamamatsu Universal Streak Camera C10910
Hamamatsu
Recording the PL kinetics of perovskite thin films.
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Solar simulator
Newport Oriel Sol3A
Newport
Providing an air-mass 1.5 global (AM1.5G) spectra for measuring the current-density – voltage (J–V) characteristics of the PSCs.
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