研究目的
To improve the performance of thermally evaporated CsPbBr3 perovskite solar cells by reducing defect densities and enhancing film morphologies using a two-step sintering method.
研究成果
The TSS method significantly improves the performance of thermally evaporated CsPbBr3 perovskite solar cells by enhancing film morphologies and reducing defect densities, leading to a champion PCE of 9.35% and excellent thermal stability.
研究不足
The study focuses on thermally evaporated CsPbBr3 films and may not be directly applicable to other fabrication methods or perovskite compositions.
1:Experimental Design and Method Selection
A two-step sintering (TSS) method was employed to modify the morphologies of thermally evaporated CsPbBr3 films and reduce defect densities.
2:Sample Selection and Data Sources
CsBr and PbBr2 precursors were used to fabricate CsPbBr3 films. The films were characterized using various techniques including XRD, UV-vis, SEM, AFM, TEM, PL, TRPL, and EIS.
3:List of Experimental Equipment and Materials
FTO glass, TiO2, CsBr, PbBr2, carbon pastes, X-ray diffractometer, ultraviolet spectrometer, field-emission scanning electron microscope, atomic force microscope, transmission electron microscope, PL microscopic spectrometer, DS081403 for TRPL, EC-lab for EIS, solar simulator, Keithley 2400 source meter, QEX10 solar cell instrument.
4:Experimental Procedures and Operational Workflow
The fabrication process involved sequential evaporating of CsBr and PbBr2 onto FTO/TiO2 substrates, followed by sintering in a muffle furnace. Carbon electrodes were then printed on the perovskite films.
5:Data Analysis Methods
Data from XRD, UV-vis, SEM, AFM, TEM, PL, TRPL, and EIS were analyzed to assess film quality, defect densities, and device performance.
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ultraviolet spectrometer
Lambda 750S
PerkinElmer
Characterizing perovskite films
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transmission electron microscope
Talos F200S
Thermo Fisher
Characterizing perovskite films
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FTO glass
OPV Technology Corp.
Substrate for the solar cell device
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femtosecond laser machine
Universal VLS2.30
USA
Etching FTO glass
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X-ray diffractometer
PANalytical-Empyrean
Characterizing perovskite films
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field-emission scanning electron microscope
Hitachi SU8020
Characterizing perovskite films
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atomic force microscope
Bruker Multimode 8
Characterizing perovskite films
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PL microscopic spectrometer
SHIMADZU RF6000
Japan
Conducting steady-state PL
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DS081403
Newport, USA
Testing TRPL decay spectra
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EC-lab
SP300
Carrying out EIS measurement
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solar simulator
Oriel 94023A
Measuring photovoltaic performances
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Keithley 2400 source meter
Measuring photovoltaic performances
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QEX10 solar cell instrument
PV Measurements, Inc., USA
Performing IPCE measurement
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