研究目的
To investigate the effect of PMMA additive on the morphology and optoelectrical properties of CsPbBr3 thin films prepared by spray coating, aiming to improve the performance of photodetectors.
研究成果
The addition of PMMA into CsPbBr3 precursor solution completely eliminates voids and reduces surface roughness in the films, leading to improved photodetector performance with high responsivity, good response speed, and favourable stability under ambient conditions.
研究不足
The study focuses on the effect of PMMA additive on CsPbBr3 thin films and photodetector performance, but does not explore the long-term stability under varying environmental conditions beyond 40 days at 20% humidity.
1：Experimental Design and Method Selection
The study involved the preparation of CsPbBr3 thin films by spray coating with the addition of PMMA to investigate its effect on film morphology and photodetector performance.
2：Sample Selection and Data Sources
CsPbBr3 thin films were prepared on glass substrates. The films were characterized using XRD, SEM, AFM, PL spectra, and transmittance measurements.
3：List of Experimental Equipment and Materials
Chemicals included CsBr, PbBr2, DMSO, DMF, CBZ, and PMMA. Equipment used were an airbrush spray-coating system, SEM (Hitachi SU8020), AFM (MultiMode 8), XRD (PANalytical X’Pert3), PL system (LabRAM HR Evolution), and UV-vis spectrophotometer (TU 1901).
4：Experimental Procedures and Operational Workflow
The process involved the preparation of CsPbBr3 and CsPbBr3(PMMA) solutions, spray deposition on glass substrates, and fabrication of photodetectors with a structure of Au/CsPbBr3(PMMA)/ITO. The films were characterized for their structural, optical, and electrical properties.
5：Data Analysis Methods
Data analysis included XRD for crystallinity, SEM and AFM for morphology, PL and transmittance for optical properties, and I-V characteristics for electrical properties of the photodetectors.
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SEM
Hitachi SU8020
Hitachi
Characterization of film morphology.
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XRD
PANalytical X’Pert3
PANalytical
Determination of crystallinity of the films.
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CsPbBr3
Used as the active material in photodetectors.
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PMMA
Additive to improve film morphology and reduce surface roughness.
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AFM
MultiMode 8
Measurement of surface roughness.
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PL system
LabRAM HR Evolution
Detection of photoluminescence spectra.
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UV-vis spectrophotometer
TU 1901
Measurement of transmittance.
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