研究目的
Investigating the use of inorganic CuFeO2 delafossite nanoparticles as an effective hole transport material for highly efficient and long-term stable perovskite solar cells.
研究成果
The study demonstrates that inorganic CuFeO2 HTM can be a promising alternative to organic HTMs in PSCs, offering superior stability and cost-effectiveness, with potential for commercialization.
研究不足
The interfacial carrier recombination kinetics between perovskite and CuFeO2 HTM layers due to existing gaps, and the need for optimization of conductivity and particle sizes for boosting FF and Voc.
1:Experimental Design and Method Selection:
Hydrothermal synthesis of CuFeO2 nanoparticles and their application as HTM in PSCs.
2:Sample Selection and Data Sources:
Fluorine-doped tin oxide (FTO) glass substrates, perovskite films, and gold back electrodes.
3:List of Experimental Equipment and Materials:
Bruker D8 Advance model X-Ray diffraction spectroscopy, Thermo Scientific XPS, Hitachi model field emission scanning electron microscopy, Nano-magnetics instruments AFM, Jeol 2100F HRTEM, Shimadzu 3600 UV-vis-NIR spectrometer, Fluorolog 322 spectrofluorometer, Krüss DSA100 drop shape analyzer, Kratos AXIS Supra spectrometer, Keithley 4200 digital source meter, Oriel Instruments solar simulator.
4:Experimental Procedures and Operational Workflow:
Fabrication of PSCs with CuFeO2 HTM, characterization of photovoltaic performance, and stability tests under various conditions.
5:Data Analysis Methods:
Analysis of XRD, XPS, SEM, AFM, HRTEM, UV-vis-NIR, PL, TRPL, UPS, SCLC, EQE, and impedance measurements.
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Jeol 2100F
2100F
Jeol
High-resolution transmission electron microscopy
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Shimadzu 3600
3600
Shimadzu
UV-vis-NIR spectrometer
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Kratos AXIS Supra
AXIS Supra
Kratos
Ultraviolet photoelectron spectroscopy
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Keithley 4200
4200
Keithley
Digital source meter
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Bruker D8 Advance
D8 Advance
Bruker
X-Ray diffraction spectroscopy
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Thermo Scientific
Al-Ka radiation
Thermo Scientific
X-ray photoelectron spectroscopy
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Hitachi
FESEM
Hitachi
Field emission scanning electron microscopy
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Nano-magnetics instruments
AFM
Nano-magnetics
Atomic force microscopy
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Fluorolog 322
322
Fluorolog
Spectrofluorometer
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Krüss DSA100
DSA100
Krüss
Drop shape analyzer
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Oriel Instruments
Solar simulator
Oriel Instruments
Light source with an air mass (AM) 1.5 spectrum
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