研究目的
To propose an interface engineering strategy for PSCs by controlling the nature of Lead halide perovskite films, specifically their interfacial grain facets, to improve the performance of PSCs without introducing extra modifier layers.
研究成果
The SSG method effectively tailors interfacial grain facets of CH3NH3PbI3 PSC, leading to improved performance due to suppressed recombination and enhanced carrier extraction. The optimized PSCs achieve an average PCE increase from 16.51±0.64% to 18.40±0.67%.
研究不足
The study focuses on CH3NH3PbI3 PSCs and may not be directly applicable to other types of perovskite materials. The SSG process requires precise temperature control, which could complicate large-scale production.
1:Experimental Design and Method Selection:
The study employs a solution-mediated secondary growth (SSG) technology to tailor interfacial grain facets in CH3NH3PbI3 PSC. The SSG temperature is controlled to achieve precise tailoring of interfacial grain facets.
2:Sample Selection and Data Sources:
CH3NH3PbI3 films are prepared via a solvent engineering assisted one-step spin-coating method. The films are then subjected to SSG treatment at controlled temperatures.
3:List of Experimental Equipment and Materials:
Includes SEM for imaging, XRD for phase analysis, UV-vis spectrometer for absorption spectra, and fluorescence spectrometer for PL measurements.
4:Experimental Procedures and Operational Workflow:
The pristine CH3NH3PbI3 film is prepared and then treated with SSG at 40 °C or 60 °C. The films are characterized before and after SSG treatment.
5:Data Analysis Methods:
The performance of PSCs is evaluated based on photovoltaic parameters extracted from J-V curves, EQE spectra, and steady-state PL results.
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Fluorescence spectrometer
HITACHI F-5000
HITACHI
Steady-state PL spectra measurement
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TRPL spectra recorder
EDINBURGH INSTRUMENT FLS 980
EDINBURGH INSTRUMENT
TRPL spectra recording
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Electrochemical workstation
CHI 660B
CHI
EIS measurements
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Digital oscilloscope
Tektronix, D4105
Tektronix
Photocurrent or photovoltage decay signals testing
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FE-SEM
ZEISS Ultra-55
ZEISS
SEM measurements
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XRD
PANalyticalX’Pert PRO
PANalytical
XRD patterns collection
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UV-vis spectrometer
Shimadzu UV-2550
Shimadzu
Absorption spectra measurement
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Sunlight simulator
Oriel 92251A-1000
Oriel
Simulated AM 1.5G illumination
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