研究目的
Investigating the effects of non-fullerene surface treatment on the performance and stability of perovskite solar cells.
研究成果
The use of IEICO-4F as an antisolution in the treatment of perovskite films during spin-coating improved the performance and stability of perovskite solar cells. The treatment established a charge transfer bridge across the top perovskite layer and the bottom layer of Spiro-OMeTAD, creating a more efficient conductivity, charge extraction, and transport in the perovskite film.
研究不足
The study did not explore the long-term stability of the treated perovskite solar cells under various environmental conditions.
1:Experimental Design and Method Selection:
The study involved the dissolution of IEICO-4F in chlorobenzene and its use as an antisolution in the treatment of perovskite films during spin-coating.
2:Sample Selection and Data Sources:
Perovskite films were prepared via the conventional one-step deposition method.
3:List of Experimental Equipment and Materials:
Scanning electron microscopy (SEM), atomic force microscopy (AFM), Grazing incidence X-ray diffraction (GIXRD), UV-Vis absorption spectra, X-ray photoelectron spectroscopy (XPS), Time-of-flight secondary-ion mass spectrometry (TOF-SIMS), steady state photoluminescence (PL), and time-resolved photoluminescence (TRPL) decay measurements were used.
4:Experimental Procedures and Operational Workflow:
The effect of IEICO-4F on the growth of MAPbI3 crystals was investigated using SEM. The crystal features in the perovskite film with and without IEICO-4F treatment were probed using GIXRD.
5:Data Analysis Methods:
The defect density was calculated using thermal admittance spectroscopy measurements.
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IEICO-4F
Ultranarrow bandgap material used to improve charge extraction and transport in perovskite solar cells.
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Spiro-OMeTAD
Hole transport layer material in perovskite solar cells.
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Chlorobenzene
Antisolvent used in the treatment of perovskite films.
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Scanning Electron Microscopy (SEM)
Used to investigate the microstructural evolution of perovskite films.
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Atomic Force Microscopy (AFM)
Used to confirm the effect of IEICO-4F on the films.
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Grazing Incidence X-ray Diffraction (GIXRD)
Used to probe the crystal features in the perovskite film.
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UV-Vis Absorption Spectra
Used to investigate the absorption spectra of perovskite films.
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X-ray Photoelectron Spectroscopy (XPS)
Used to investigate the surface chemical composition of perovskite films.
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Time-of-flight Secondary-ion Mass Spectrometry (TOF-SIMS)
Used to study the distribution of elements in the samples.
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Steady State Photoluminescence (PL)
Used to explore perovskite films deposited on fluorine-doped tin oxide (FTO)/TiO2 substrates.
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Time-resolved Photoluminescence (TRPL) Decay Measurements
Used to explore perovskite films deposited on fluorine-doped tin oxide (FTO)/TiO2 substrates.
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