研究目的
Investigating the enhancement of spontaneous emission in perovskite quantum dots coupled to plasmonic nanowire networks using a polymer spacer to regulate the lossy characteristics of the plasmonic cavity.
研究成果
The study demonstrates fast and bright emission in perovskite quantum dot films coupled to silver nanowire networks, using a PVA spacer to regulate the plasmonic cavity's lossy characteristics. It identifies different spontaneous emission features based on PVA spacer thickness and highlights the trade-off between radiative processes and nonradiative metal loss.
研究不足
The study identifies a trade-off between Purcell-enhanced radiative rate and metal loss, indicating that achieving both bright and fast emission is challenging. The enhancements are not as high as those seen in hot spots due to the mode not being as well confined.
1:Experimental Design and Method Selection:
The study involves coupling perovskite quantum dots (PQDs) to silver nanowire networks (NWKs) with a polyvinyl alcohol (PVA) spacer to regulate the plasmonic cavity's lossy characteristics. The methodology includes fluorescence microscopy, and time-integrated and time-resolved emission measurements.
2:Sample Selection and Data Sources:
CsPbX3 PQDs were synthesized and coupled to Ag nanowire networks with varying PVA spacer thicknesses. The samples were prepared with the same PQD loadings to ensure consistent surface density.
3:List of Experimental Equipment and Materials:
Equipment includes a JEM1200EX transmission electron microscope (TEM), Zeiss Supra 40 electron microscope, Dimension Icon AFM, Hitachi U4100 Spectrometer, Axio Observer.Z1 microscope, and F980 spectrometer with a single photon photomultiplier detector.
4:Experimental Procedures and Operational Workflow:
The study involved preparing PQD films on different substrates (quartz, PVA layer, NWK), measuring their fluorescence intensity and emission rates, and analyzing the effects of PVA spacer thickness on these properties.
5:Data Analysis Methods:
The data was analyzed using time-correlated single photon counting (TCSPC) to assess the spontaneous emission rate of the coupled PQDs, with decay curves fitted using a biexponential function.
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F980 spectrometer
F980
Edinburgh Instruments
Time integrated and resolved photoluminescence (PL) spectra recording
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JEM1200EX transmission electron microscope
JEM1200EX
JEOL
High resolution microscopy measurements
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Zeiss Supra 40 electron microscope
Supra 40
Zeiss
Scanning electron microscopy (SEM) imaging
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Dimension Icon AFM
Dimension Icon
Bruker Instruments Inc.
Atomic force microscopy (AFM) imaging
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Hitachi U4100 Spectrometer
U4100
Hitachi
UV-vis absorption spectra recording
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Axio Observer.Z1 microscope
Axio Observer.Z1
Zeiss
Micro-photoluminescence imaging
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