研究目的
Investigating the site-selective atomic layer precision thinning of MoS2 via laser-assisted anisotropic chemical etching for optoelectronic applications.
研究成果
The study demonstrates a robust method for site-selective atomic layer precision thinning of MoS2, offering potential for various optoelectronic applications. The self-limited thinning process, monitored by in-situ reflectance measurement, ensures precise control over the thinning process.
研究不足
The technical and application constraints include the need for precise control of laser power and scanning speed to achieve atomic layer precision thinning without damaging the underlying layers.