研究目的
To enhance the power conversion efficiency (PCE) of a heterostructure (bismuth ferrite/zinc oxide) solar cell device with different types of electrodes and annealing environments.
研究成果
The study successfully demonstrated the enhancement of PCE in a heterostructure solar cell device through the use of graphene/indium tin oxide hybrid electrodes and optimized annealing conditions. The PCE was improved from 4.1% to 7.4%, highlighting the potential of BFO thin films in optoelectronic applications.
研究不足
The study focuses on the enhancement of PCE through annealing conditions and electrode types but does not explore the scalability of the fabrication process or the long-term stability of the heterostructure device under operational conditions.
1：Experimental Design and Method Selection:
The study involved the fabrication of a heterostructure device (bismuth ferrite/zinc oxide) with different types of electrodes (graphene/indium tin oxide hybrid electrodes) to enhance PCE. The bismuth ferrite (BFO) thin film was grown by atomic layer deposition (ALD) and annealed in different environments (helium, nitrogen, and oxygen).
2：Sample Selection and Data Sources:
The BFO thin film was deposited on ZnO thin film by ALD. The samples were annealed in different atmospheres and with different electrodes to study their effects on solar cell applications.
3：List of Experimental Equipment and Materials:
ALD for BFO thin film growth, FE-SEM, XRD, AFM, and XPS for characterization, and Hall measurement system for electrical measurements.
4：Experimental Procedures and Operational Workflow:
The BFO thin film was deposited on ZnO by ALD, annealed in different atmospheres, and characterized for structural, magnetic, and dielectric properties. The heterostructure device was then measured for PCE under different conditions.
5：Data Analysis Methods:
The study analyzed the effect of annealing conditions and electrodes on the leakage current, dielectric properties, and PCE of the heterostructure device.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容-
X-ray Diffraction (XRD)
JDX-11
Joel Company Ltd., Japan
Used to characterize the crystal structure and size of BFO nanostructures.
-
Atomic Layer Deposition (ALD) system
Used for the deposition of bismuth ferrite (BFO) thin films.
-
Field-Emission Scanning Electron Microscope (FE-SEM)
Used for viewing the top surface and cross-sectional image of the heterostructure device.
-
Atomic Force Microscope (AFM)
Used to demonstrate the surface morphology and roughness of BFO thin film.
-
X-ray Photoelectron Spectroscopy (XPS)
Used to check the chemical state of BFO thin film.
-
Superconducting Quantum Interference Devices (SQUID)
Used to check the magnetic properties of BFO thin films.
-
Quantum Design Physical Properties Measurement System (PPMS)
Used for the DC magnetization measurement of BFO nanostructures at room temperature.
-
Keithley 2400
Used for the current-voltage (I–V) measurement for the solar cell.
-
登录查看剩余6件设备及参数对照表
查看全部
