研究目的
Investigating the effects of In doping on the photoresponse characteristics of SnS2-based photodetectors.
研究成果
In doping is an effective method to modulate the properties of SnS2-based photodetectors, significantly improving their photoresponse speed and reducing dark currents. This paves the way for their associated applications in optoelectronics.
研究不足
The crystallinity of SnS2 became poor at higher In doping concentrations, and the 6 at% In doping concentration is close to the limit of In doping.
1:Experimental Design and Method Selection:
In-doped SnS2 nanosheets were synthesized via a facile hydrothermal method. The In doping concentration was controlled by changing the amount of indium chloride added into the aqueous solution before the hydrothermal treatment.
2:Sample Selection and Data Sources:
Pristine and In-doped SnS2 nanosheets were synthesized and characterized.
3:List of Experimental Equipment and Materials:
Scanning electron microscope (SEM, Nova NanoSEM 450, FEI Company), transmission electron microscope (TEM, Tecnai G2 F20 S-Twin, FEI Company), X-ray diffractometer (XRD, Rigaku Smartlab, Rigaku Corporation), Raman spectrometer (Renishaw In Via, Renishaw Company), X-ray photoelectrons spectrometer (XPS, Thermo Escalab 250Xi, TMO Company), and energy dispersive spectrometer (EDS, AMETEK Octane Plus, AME Company).
4:Experimental Procedures and Operational Workflow:
The products were centrifuged and rinsed twice with distilled water and ethanol, before drying at 60 °C for 6 h under vacuum. Photodetectors were fabricated and their photoresponsive characteristics were measured.
5:Data Analysis Methods:
The photoresponse time was analyzed using fitting equations to determine the rise and fall times.
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X-ray diffractometer
Rigaku Smartlab
Rigaku Corporation
Characterizing the phase structures of the samples.
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X-ray photoelectrons spectrometer
Thermo Escalab 250Xi
TMO Company
Determining the elemental composition and the chemical states of the samples.
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Scanning electron microscope
Nova NanoSEM 450
FEI Company
Observing the morphology and phase structures of the samples.
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Transmission electron microscope
Tecnai G2 F20 S-Twin
FEI Company
Observing the crystal structure and elemental distribution of the samples.
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Raman spectrometer
Renishaw In Via
Renishaw Company
Investigating the elemental composition and distribution of the samples.
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Energy dispersive spectrometer
AMETEK Octane Plus
AME Company
Investigating the elemental composition and distribution of the samples.
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