研究目的
Investigating the performance variations in Cu(In1?xGax)Se2 (CIGS) solar cells with different grain sizes upon annealing, focusing on the correlation between performance and composition at the nanoscale.
研究成果
The study demonstrated that poor performing areas in large-grain CIGS are correlated with a Cu-deficient phase, while defects in small-grain CIGS are not correlated with Cu distribution. The methodology of combined operando and in-situ X-ray microscopy was established, showing potential for nanoscopic performance mapping under actual operating conditions.
研究不足
The study is limited by the spatial resolution given by the device's diffusion length, and the sensitivity of XRF measurements to certain elements like In and Se is reduced. Additionally, the absolute quantification of area densities by XRF is affected by systematic errors.
1：Experimental Design and Method Selection
Multi-modal X-ray microscopy was used to probe the performance and composition of CIGS solar cells. The study involved temperature-dependent XBIV and XRF measurements to assess electrical performance and elemental distribution.
2：Sample Selection and Data Sources
Two types of CIGS solar cells with different grain sizes were studied: 'Large grain CIGS' (LG) and 'Small grain CIGS' (SG). The LG sample was grown at a higher temperature, resulting in larger grains, while the SG sample was grown at a lower temperature, resulting in smaller grains.
3：List of Experimental Equipment and Materials
The experiments were conducted at the beamline 2-ID-D of the Advanced Photon Source (APS) at Argonne National Laboratory (ANL). Key equipment included a zone plate for focusing X-rays, an energy-dispersive single-element Si detector for XRF, and a heating stage for temperature control.
4：Experimental Procedures and Operational Workflow
The X-ray beam was modulated at 318 Hz, and the sample was scanned across the probe beam in continuous mode for fast XBIV measurements. Temperature was controlled with a heating stage, and measurements were taken from room temperature to 100 ?C.
5：Data Analysis Methods
Data analysis included image registration for aligning maps at different temperatures, XRF spectra analysis using MAPS software, and statistical correlation of electrical performance with elemental distribution.
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