研究目的
Investigating the effects of bulk recrystallization using formadinium chloride (FACl) on mixed-cation lead mixed-halide perovskite solar cells to remove excess PbI2 and improve device performance and stability.
研究成果
The addition of FACl to the triple-cation (FA/MA/Cs) perovskite has been demonstrated to recrystallize the bulk crystals throughout the film, leading to improved optoelectronic qualities, reduced interfacial recombination, and enhanced charge transport. This method resulted in a power conversion efficiency (PCE) over 20% for planar heterojunction devices, indicating an important advance in perovskite device formation and stability.
研究不足
The study focuses on the removal of excess PbI2 and its effects on device performance and stability. The exact reaction pathway of FACl addition to perovskite is not fully clear, and further investigation is needed to understand the mechanism behind the observed improvements.
1：Experimental Design and Method Selection:
The study employed a bulk recrystallization process using FACl on perovskite films to remove excess PbI2. Grazing incidence XRD was used to analyze the crystal structure as a function of depth profiling.
2：Grazing incidence XRD was used to analyze the crystal structure as a function of depth profiling.
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Mixed-cation lead mixed-halide perovskite films with a slight excess of PbI2 were used as the platform for demonstrating the recrystallization method.
3：List of Experimental Equipment and Materials:
FACl, isopropanol (IPA), X-ray diffraction (XRD), Grazing incidence XRD (GIXRD), Scanning Electron Microscope (SEM), Kelvin probe force microscopy (KPFM), ultraviolet-visible (UV-vis) spectroscopy, photoelectron spectroscopy in air (PESA), photoluminescence (PL) spectroscopy, impedance spectroscopy (IS).
4：Experimental Procedures and Operational Workflow:
FACl was dissolved in IPA and deposited via dynamic spin coating followed by short annealing. The structural effects were studied by XRD and GIXRD. Surface morphology and potential homogeneity were investigated using KPFM. Photophysical properties were assessed through UV-vis, PL, and IS measurements.
5：Data Analysis Methods:
XRD and GIXRD data were analyzed to observe crystal structure changes. KPFM data were used to assess surface potential homogeneity. UV-vis and PL data were analyzed for optoelectronic properties. IS data were fitted to understand charge transport dynamics.
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