研究目的
Investigating the direct synthesis of monolayer graphene on silicon substrates for near-infrared photodetectors without post-transfer processes.
研究成果
The study successfully demonstrates a scalable method for directly synthesizing monolayer graphene on Si substrates, enabling high-performance near-infrared photodetectors with high detectivity and responsivity. This approach is compatible with current nano/micro-fabrication systems, advancing graphene applications in microelectronics.
研究不足
The annealing temperature must not exceed 900°C to prevent Cu layer wetting and evaporation, and the annealing time is limited to 13 minutes. Residual Cu atoms in the Si substrate, though minimal, may affect graphene quality.
1:Experimental Design and Method Selection:
The study employs a thermal annealing process with a Cu catalyst and PMMA as the carbon source to synthesize graphene directly on Si substrates.
2:Sample Selection and Data Sources:
Si substrates are cleaned and coated with PMMA, followed by Cu deposition via electron beam evaporation.
3:List of Experimental Equipment and Materials:
Equipment includes a CVD chamber, electron beam evaporator, and characterization tools like Raman spectroscopy, AFM, TEM, SIMS, XPS, and STM. Materials include Si substrates, PMMA, and Cu.
4:Experimental Procedures and Operational Workflow:
The process involves PMMA spin-coating, Cu deposition, thermal annealing under H2/Ar flow, and Cu removal.
5:Data Analysis Methods:
Characterization techniques assess graphene quality, layer number, and uniformity, with electrical properties evaluated using semiconductor parameter analyzers.
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Raman scattering
HORIBA Jobin Yvon HR800
HORIBA Jobin Yvon
Evaluation of graphene layer number, quality, and uniformity.
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Semiconductor parameter analyzer
B1500A and Keithley 4200
Keithley
Electrical properties evaluation of graphene/Si devices.
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PMMA
MicroChem Corp. 950, A4
MicroChem Corp.
Carbon source for graphene synthesis and barrier to prevent Cu diffusion into Si substrate.
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Cu
Catalyst for graphene synthesis.
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Si substrate
Substrate for graphene synthesis.
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AFM
Multimode 8
Surface morphology and roughness analyses.
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TEM
FET-Tecnai G2F20 S-7WIN
FET
Thickness and crystalline quality evaluation of graphene.
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SIMS
Cameca IMS-4F
Cameca
Element distribution analysis along the depth of graphene.
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XPS
PHI 5802
Physical Electronics Inc
Surface chemical composition analysis of graphene.
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STM
SPECS JT-STM
SPECS
Crystalline quality and microstructure analysis of graphene.
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