研究目的
Investigating the development and performance of hybrid-integrated diode lasers with feedback from low-loss silicon nitride circuits for applications requiring narrow spectral linewidth and high output power.
研究成果
The research demonstrates that hybrid integrated semiconductor lasers with Si3N4 feedback circuits can achieve ultra-narrow linewidths, high output power, and wide spectral coverage. These lasers show promise for applications in sensing, metrology, and communications. Future work aims to further reduce linewidths and extend operational wavelengths into the visible range.
研究不足
The study is limited by the current fabrication techniques for integrating semiconductor amplifiers with Si3N4 circuits, which may introduce coupling losses. Additionally, the complexity of the laser cavity design with embedded microring resonators complicates the precise prediction of laser properties.
1：Experimental Design and Method Selection:
The study involves the design of hybrid-integrated diode lasers with feedback from low-loss silicon nitride (Si3N4 in SiO2) circuits. The methodology includes the use of microring resonators for spectral filtering and extending the photon lifetime to achieve narrow linewidths.
2：Sample Selection and Data Sources:
The samples include hybrid-integrated diode lasers with various configurations (single gain section, dual-gain operation, etc.). Data is collected on output power, spectral coverage, and linewidth.
3：List of Experimental Equipment and Materials:
Equipment includes semiconductor optical amplifiers, Si3N4 waveguide circuits, and packaging materials for laser assembly. Materials include InP for gain sections and Si3N4 for feedback circuits.
4：Experimental Procedures and Operational Workflow:
The process involves assembling the lasers in butterfly packages, controlling temperature with Peltier elements, and measuring output characteristics such as power, linewidth, and spectral coverage.
5：Data Analysis Methods:
Analysis includes measuring the power spectral density of frequency noise to determine intrinsic linewidth and using optical spectrum analyzers for spectral coverage.
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