研究目的
Investigating the development of a low-cost, high-efficiency counter electrode for dye-sensitized solar cells (DSSCs) using NiO@NiS@graphene nanocomposite.
研究成果
The NiO@NiS@G nanocomposite exhibits promising electrochemical and photovoltaic performance as a counter electrode in DSSCs, offering a cost-effective alternative to Pt. The hierarchical structure enhances electrical conductivity and catalytic properties, making it a viable candidate for large-scale applications.
研究不足
The power conversion efficiency of NiO@NiS@G (2.10%) is still lower than that of commercial Pt (2.77%), indicating room for improvement in electrical conductivity and catalytic activity.
1:Experimental Design and Method Selection
NiO@NiS@G nanocomposite was synthesized by a simple hydrothermal method. The structural composition was analyzed using XRD, Raman spectroscopy, XPS, and morphology was studied using FESEM and TEM.
2:Sample Selection and Data Sources
Graphite oxide (GO) was synthesized by modified Hummers method. Nickel nitrate and thiourea were used as precursors for NiO@NiS synthesis.
3:List of Experimental Equipment and Materials
Advanced X-ray Diffractometer, Field emission scanning electron microscope (FE-SEM; JEOL JSM 7001F), Transmission electron microscopy (TEM; JEM 2100F JEOL Ltd.), Raman Spectrometer (JASCO NR 7500), X-ray photoelectron spectroscopy (Shimadzu ESCA 3400), Solartron 1280C electrochemical test system.
4:Experimental Procedures and Operational Workflow
The synthesis involved hydrothermal treatment at 180 oC for 12 h, followed by annealing at 300 oC. The nanocomposite was then coated on FTO substrates using a spray coating technique for electrochemical and photovoltaic characterization.
5:Data Analysis Methods
Electrochemical performance was evaluated using cyclic voltammetry and electrochemical impedance spectroscopy. Photovoltaic performance was measured using a solar simulator.
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Field emission scanning electron microscope
JEOL JSM 7001F
JEOL
Surface morphology analysis
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Transmission electron microscopy
JEM 2100F
JEOL
Morphology analysis
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Raman Spectrometer
JASCO NR 7500
JASCO
Analysis of carbon-based materials
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X-ray photoelectron spectroscopy
Shimadzu ESCA 3400
Shimadzu
Elemental composition analysis
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Advanced X-ray Diffractometer
Structural composition analysis
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Solartron 1280C electrochemical test system
1280C
Solartron
Cyclic Voltammetry analysis
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Solar simulator
JASCO
Current–voltage (I-V) characteristics measurement
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Picoammeter
Keithley
Current measurement
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