摘要： First-ever 28 nm embedded split-gate MONOS (SG-MONOS) ?ash macros have been developed to increase memory capacity embedded in micro controller units and to improve performance over wide junction temperature range from C to 170 C as demanded strongly in automotive uses. Much attention has been paid to the degradation of the reliability characteristics along with the process shrinkage. Temperature-adjusted word-line overdrive scheme improves random read access frequency by 15% and realizes both of 6.4 GB/s read throughput by 200 MHz no-wait random access of code ?ash macros and more than ten times longer TDDB lifetime of WL drivers. Temperature-adaptive step pulse erase control (TASPEC) improves the TDDB lifetime of dielectric ?lms between metal interconnect layers by three times. TASPEC is particularly useful for a data ?ash macro with one million rewrite cycles. Source-side injection (SSI) program with negative back-bias voltage achieves 63% reduction of program pulse time and, consequently, realizes 2.0 MB/s write throughput of code ?ash macros. A spread spectrum clock generation and a clock phase shift technique are introduced for charge pump clock generation in order to suppress EMI noise due to high write throughput of code ?ash macros, and peak power of EMI noise is reduced by 19 dB.