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Compact Beam Scanning Flat Array Based on Substrate Integrated Waveguide

DOI:10.1109/TAP.2019.2943441 期刊:IEEE Transactions on Antennas and Propagation 出版年份:2019 更新时间:2025-09-19 17:13:59
摘要: A compact beam scanning flat antenna array with high gain based on the substrate integrated waveguide (SIW) is presented in this paper. The radiation elements are the continuous transverse stub (CTS) constructed by SIW, which are arrayed on the substrate. The SIW-CTS array has a 4 dB higher gain than the traditional CTS array with the metal parallel plate waveguide and is analyzed. A new compact the theoretical explanation corporate-feed network consisting of a SIW horn and a flat lens is also proposed. The flat lens could convert the cylindrical wave-front generated by the feed probe and the SIW-horn to a planar wave-front for feeding the CTS array. The Taylor distribution of the feed level made the array has a low sidelobe and high gain. The beam scanning of the array could be realized by simply moving the small SIW-horn along the line across the focal point. An 8-element array is designed, simulated and fabricated to verify the design. The measured results show that the scanning range is from -35° to 35° with the highest gain of being 20.6dBi and the side lobe level of -25.2dB at the broadside.
作者: Houtong Qiu,Xue-Xia Yang,Yingjie Yu,Tian Lou,Zhangfei Yin,Steven Gao
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To present a compact beam scanning flat antenna array with high gain based on the substrate integrated waveguide (SIW) and analyze its performance compared to traditional CTS arrays.

The proposed SIW-CTS array has a 4dBi higher gain than the metal parallel waveguide CTS and achieves beam scanning by simply moving a small SIW-horn. The measured gain at the focal point is 20.6dBi with a side lobe level of -25.2dB at 13 GHz. The beam steers from -35° to 35° with the 3-dB gain decreasing. This design is suitable for next-generation Satcom terminals and mobile ground stations.

The discrepancies between simulated and measured results are mainly caused by the experimental process, such as the inaccurate value of the substrate dielectric constant and the error of welding SIW-horn coaxial probe insertion height.

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