研究目的
Investigating the enhancement of efficiency and stability in perovskite nanocrystal light-emitting diodes (LEDs) through the decoration of nickel oxides on the nanocrystal surface.
研究成果
Decoration of NiOx on CsPbBr3 nanocrystal surfaces significantly enhances the photoluminescence quantum yield and LED performance, achieving a high EQE of 16.8% and improved operational stability. This method presents a promising approach for developing high-efficiency and stable perovskite nanocrystal LEDs.
研究不足
The reproducibility of devices fabricated using illumination-treated samples was not optimal, possibly due to difficulties in controlling NiOx formation. The study suggests that more controllable methods, like peroxide treatment, could mitigate this issue.
1:Experimental Design and Method Selection:
The study involved decorating NiOx on the CsPbBr3 nanocrystal surface through adsorption and a sequential oxidation treatment to improve LED performance.
2:Sample Selection and Data Sources:
CsPbBr3 nanocrystals were synthesized and treated with DDAB and Ni(Ac)2, followed by oxidation treatments (illumination or peroxide treatment with BPO).
3:List of Experimental Equipment and Materials:
Materials included Cs2CO3, ODE, OA, OAm, PbBr2, DDAB, Ni(Ac)2, BPO, and various solvents. Equipment included TEM, XRD, PL spectrophotometer, UV-vis spectrophotometer, XPS, and LED fabrication tools.
4:Experimental Procedures and Operational Workflow:
The process involved synthesis of CsPbBr3 NCs, DDAB treatment, Ni2+ adsorption, oxidation to NiOx, and device fabrication.
5:Data Analysis Methods:
Performance of LEDs was evaluated based on EQE, turn-on voltage, and operational lifetime, with materials characterized by TEM, XRD, PL, UV-vis, XPS, and XAFS.
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Hitachi F-7000 fluorescence spectrophotometer
F-7000
Hitachi
Recording photoluminescence (PL) spectra.
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Hitachi U-3900 spectrophotometer
U-3900
Hitachi
Recording UV-vis absorption spectra.
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Kratos Axis UltraDLD
Axis UltraDLD
Kratos
Determining the chemical compositions of the NCs surface by XPS.
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Keithley 2400 source
2400
Keithley
Measuring luminance–current–voltage (L–I–V) characteristics.
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FEI (TALOS F200X) transmission electron microscope
TALOS F200X
FEI
Investigation of morphologies, high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and elemental mappings.
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Bruker D8 Advance X-ray Diffractometer
D8 Advance
Bruker
Performing X-ray diffraction (XRD) patterns.
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Konica Minolta LS-160 luminance meter
LS-160
Konica Minolta
Measuring luminance–current–voltage (L–I–V) characteristics.
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