研究目的
Investigating the use of in-situ Optical Emission Spectroscopy (OES) to gain information about local processing conditions during Selective Laser Melting (SLM) of 304L stainless steel.
研究成果
The study demonstrated a strong relationship between local processing conditions obtained through OES and SLM sample properties, indicating potential for OES in SLM part qualification and controls. The build chamber atmosphere type and pressure significantly impact the measured OES signals and melt pool properties.
研究不足
OES did not provide meaningful information for chamber pressures less than 400 Torr. The effects of dispersion and solid angle on signal collection were noted but mitigated by experimental design.
1:Experimental Design and Method Selection:
The study involved inserting a spectrometer into the SLM system laser beam path to measure visible light emitted from the melt pool and plume during processing.
2:Sample Selection and Data Sources:
Single layers of 304L stainless steel powder were processed under various conditions (laser power, build chamber atmosphere type, and pressure).
3:List of Experimental Equipment and Materials:
A home-built SLM system with an IPG Photonics YLR-500 continuous wave fiber laser and an Andor Technology SR-750 spectrometer were used.
4:Experimental Procedures and Operational Workflow:
The laser was scanned in a raster pattern at a constant scan speed and hatch spacing. OES data was collected and processed to remove incandescent background.
5:Data Analysis Methods:
The processed OES signals were averaged over the layer area to produce representative emission spectra. Melt pool sizes were measured through optical microscopy and correlated with emission line intensities.
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DMLP900
DMLP900
Thorlabs
Dichroic mirror used to insert the spectrometer into the laser beam path.
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iStar 734
iStar 734
Andor Technology
ICCD used with the spectrometer.
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F220SMA
F220SMA
Thorlabs
Collimator used to couple the optical fiber to the spectrometer.
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YLR-500
YLR-500
IPG Photonics
Continuous wave fiber laser used in the SLM system.
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SR-750
SR-750
Andor Technology
Spectrometer used for OES measurements.
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D30
D30
IPG Photonics
Collimator used with the YLR-500 laser.
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hurrySCAN
hurrySCAN
SCANLAB
Controls the laser beam x-y position.
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