研究目的
This work demonstrates the application of bimetallic oxide nanowires (NWs) for deep UV-photodetectors, aiming to advance the state-of-the-art in UV detection technology.
研究成果
The GaInO3-NWs based MSM photodetector fabricated using an inexpensive and scalable electrospinning technique has shown ultra-high responsivity, PDCR, detectivity, and EQE%, advancing the state-of-the-art in UV detection technology. The device also displays impressive dynamic performance at very low bias voltage, promising for commercial applications at low power in a compact size.
研究不足
The dark current has been increased significantly due to alloying In with Ga2O3, which is a technical constraint that needs optimization.
1：Experimental Design and Method Selection:
The Ga-In based NWs were fabricated using a low-cost and scalable electrospinning method. The fabrication process involved the synthesis of NWs on a cleaned quartz substrate followed by Al (100 nm)/Au (20 nm)-electrode deposition on top of the NWs sheet.
2：Sample Selection and Data Sources:
The solution for electrospinning was prepared with Polyvinylpyrrolidone (PVP), Gallium Nitrate Hydrate, Indium Nitrate Hydrate, DMF, and Ethanol. The solution was stirred for 12 hours before electrospinning.
3：List of Experimental Equipment and Materials:
Equipment used includes an electrospinning system (E-SPIN Nanotech, India), SEM (Raith), X-ray diffractometer (Smart lab, Rigaku Japan), XPS (Thermo Scientific NEXSA), UV-VIS (LAMBDA 750 UV/VIS/NIR, PerkinElmer, USA), and Keithley 4200 SCS for electrical properties analysis.
4：Experimental Procedures and Operational Workflow:
The electrospinning process was conducted with specific parameters (applied electrode voltage=17 kilo-volts, electrode spacing=18 cm, flow rate=0.25 ml/hr). The deposited nanofibers were dried and annealed before morphological and structural analysis.
5：25 ml/hr). The deposited nanofibers were dried and annealed before morphological and structural analysis. Data Analysis Methods:
5. Data Analysis Methods: The optical properties were analyzed using UV-VIS spectroscopy, and electrical properties were analyzed under dark and deep UV illumination.
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X-ray diffractometer
Smart lab
Rigaku Japan
Structural properties analysis
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UV-VIS
LAMBDA 750 UV/VIS/NIR
PerkinElmer, USA
Optical properties analysis
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electrospinning system
E-SPIN Nanotech
India
Fabrication of nanowires
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SEM
Raith
Morphological analysis
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XPS
Thermo Scientific NEXSA
Elemental constituents and their chemical states analysis
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Keithley 4200 SCS
Electrical properties analysis
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UV detector
SPER Scientific, UVA/B Light Meter 850009
Intensity calibration
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