研究目的
To investigate the effect of nitrogen-doped carbon quantum dots (N-CQDs) as a novel additive on the power conversion efficiency of perovskite solar cells through surface passivation.
研究成果
The introduction of N-CQDs as an additive in perovskite solar cells significantly improves their power conversion efficiency by enhancing charge transport properties and passivating trap states. The optimal doping concentration was found to be 3 vol%, yielding a PCE of 14%. This method presents a simple and effective approach to fabricating high-efficiency perovskite solar cells.
研究不足
The study focuses on the effect of N-CQDs on the efficiency of perovskite solar cells but does not extensively explore the long-term stability under ambient conditions or the scalability of the fabrication process.
1:Experimental Design and Method Selection:
The study involved the synthesis of N-CQDs and their incorporation into CH3NH3PbI3 solar cells to study their effect on nonradiative charge back recombination and trap states passivation.
2:Sample Selection and Data Sources:
The samples included perovskite solar cells with and without N-CQDs additive.
3:List of Experimental Equipment and Materials:
Equipment used included XPS, TEM, UVeVis spectrophotometer, SEM, AFM, and solar simulator. Materials included PbI2, CH3NH3I, PEDOT:PSS, PCBM, and Al.
4:Experimental Procedures and Operational Workflow:
The process involved the synthesis of N-CQDs, fabrication of perovskite solar cells with varying volumes of N-CQDs, and characterization of their morphological and electrical properties.
5:Data Analysis Methods:
The data was analyzed using Scherrer formula for crystal size calculation, Tauc plot for band gap determination, and J-V curves for photovoltaic characteristics.
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JEOL JEM 2100 FHRTEM brand Transmission Electron Microscope
JEM 2100 FHRTEM
JEOL
Particle scanning measurements
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Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer
K-Alpha
Thermo Scientific
X-ray photoelectron spectroscopy
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Keithley 2400 source meter
2400
Keithley
Current density-voltage characteristics measurement
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Bruker Advance D8 instrument
Advance D8
Bruker
X-ray diffraction analyses
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Zeiss Evo
Evo
Zeiss
Scanning electron microscopy
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Shimadzu UVmini-1240 ultravioletevisible (UVeVis) absorption spectrometer
UVmini-1240
Shimadzu
Optical absorption analyses
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PerkinElmer Lambda 25 UVeVis spectrophotometer
Lambda 25
PerkinElmer
Optical absorption analyses
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PerkinElmer LS 55luminescence spectrometer
LS 55
PerkinElmer
Luminescence spectrometry
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NanoMap-500LS 3D Stylus
500LS
NanoMap
Film thickness measurement
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NT-MDT AFM NTEGRA Solaris
NTEGRA Solaris
NT-MDT
Atomic force microscopy
-
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