研究目的
Investigating the fabrication and performance of a visible-light photodetector using ultrasonically exfoliated MoSe2 nanocrystals.
研究成果
The Ag/MoSe2 NCs/ITO photodetector demonstrated excellent performance in the visible range with remarkable values of responsivity, EQE (%), and specific detectivity. The fabrication technique presented is innovative and efficient for developing large-area optoelectronic devices.
研究不足
The study does not discuss the long-term stability and scalability of the photodetector for industrial applications.
1:Experimental Design and Method Selection:
The study employed a two-step method involving electrophoresis deposition (EPD) and direct transfer of MoSe2 nanocrystals (NCs) thin film for fabricating a visible-light photodetector.
2:Sample Selection and Data Sources:
Bulk MoSe2 was grown by direct vapour transport (DVT) and then exfoliated into nanocrystals via liquid-phase exfoliation in DMF.
3:List of Experimental Equipment and Materials:
High-resolution transmission electron microscopy (TEM), atomic force microscopy (AFM), Raman spectroscopy, UV-Visible spectroscopy, X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM) were used for characterization.
4:Experimental Procedures and Operational Workflow:
MoSe2 NCs were deposited onto ITO substrate by EPD, detached by dipping into water, and transferred onto etched ITO substrate for device fabrication.
5:Data Analysis Methods:
The performance of the photodetector was evaluated by measuring responsivity, external quantum efficiency (EQE), and specific detectivity.
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High-resolution transmission electron microscopy
JEOL JEM 2100
JEOL
Characterization of MoSe2 nanocrystals
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Scanning electron microscopy
JEOL JSM6010 LA
JEOL
Surface and cross-section study of deposited MoSe2 film
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UV-Visible absorbance spectrum
Ocean Optics, USB20000+XR1-ES
Ocean Optics
Absorbance ability determination in spectral range
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Keithley 4200 source measure unit
4200
Keithley
Electrical measurements
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CHI660E electrochemical workstation
660E
CHI
Electrical measurements assisted by different wavelength light source
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Atomic force microscopy
NT-MDT, Ntegra Aura
NT-MDT
Morphology study of exfoliated NCs
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Micro Raman spectroscopy
Structural property study of 2D materials
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X-ray photoelectron spectroscopy
SPECS GmbH spectrometer (Phoibos 100 MCD Energy Analyser)
SPECS GmbH
Chemical state and bonding study of as-synthesized MoSe2 NCs
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