研究目的
To assess solar cell contacting structures using magnetic field imaging and to identify different contacting fault types by inducing specific current flow patterns.
研究成果
The method demonstrated allows for the identification of contacting faults in solar cells without the need for specific test structures. Excellent agreement between magnetic field measurements and circuit simulations was achieved, indicating the method's suitability for extracting meaningful properties of contacting schemes.
研究不足
Difficulties in distinguishing between currents flowing on the front and rear surfaces of solar cells under standard contacting scenarios. Further work is needed to separate the effects of contact and sheet resistance in a particular contacting scheme.
1：Experimental Design and Method Selection:
The study uses magnetic field imaging to monitor the magnetic field near the surface of a solar cell under different operating conditions. Circuit network modelling is used in conjunction with MF images to study different solar cell contacting structures.
2：Sample Selection and Data Sources:
The study investigates standard busbar contacting schemes and multi-wire contacting schemes on actual solar cell samples.
3：List of Experimental Equipment and Materials:
A linear sensor array from DENKweit is used for 2D MF measurements, capable of measuring all three spatial magnetic field components (Bx, By, Bz) simultaneously with a resolution of about 0.5 μT.
4：5 μT.
Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: The sensor array is scanned linearly across the cell to produce a 2D magnetic field map. Different current flow patterns are induced to study the contacting schemes.
5：Data Analysis Methods:
The magnetic field images are compared with circuit simulations using LT SPICE to extract contact properties.
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