研究目的
To study the ferroelectric properties and the structural changes of the KNN nanowire-arrays using the pulsed laser photoacoustic technique during heating.
研究成果
The growth of high performance vertically aligned KNN NWAs on Pt(111)/TiO2/SiO2/Si substrates was achieved by PLD under two different deposition conditions. The NWAs have orthorhombic structure with a small amount of secondary phases. PFM measurements confirmed the piezoelectricity of the NWAs, with high piezoelectric coefficient. Analysis of the phase transitions by PLPA technique showed that the two transitions of the K2 sample possess lower temperatures than the reported in KNN bulk ceramic.
研究不足
The absence of the (O-T) phase transition in K1 may be due to the superposition with the signal caused by the evaporation of water. The presence of secondary phases could affect the piezoelectric properties.
1：Experimental Design and Method Selection:
Pulsed laser deposition (PLD) was used to synthesize piezoelectric nanowire-arrays of K
2：5Na5NbO3 (KNN) on Pt/TiO2/SiO2/Si substrates under two different deposition conditions. Sample Selection and Data Sources:
KNN NWAs were grown onto Pt(111)/TiO2/SiO2/Si substrates at two different temperatures and fluences.
3：List of Experimental Equipment and Materials:
KrF excimer laser, Ultima IV Rigaku diffractometer, JEOL 7800F Schottky field emission scanning microscope, WiTec Alpha 300R spectrophotometer, XE-7 AFM, lock-in amplifier SR865A, pulsed laser Nd:YAG, piezoelectric ceramic sensor, digital oscilloscope TDS5054B.
4：4B. Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Deposition of KNN NWAs, XRD analysis, SEM observation, Raman spectra measurement, ferroelectric properties measurement by RT-PFM, phase transition analysis by PLPA technique.
5：Data Analysis Methods:
XRD patterns analysis, Raman spectra analysis, PFM signal analysis, correlation analysis of PA signals.
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Ultima IV Rigaku diffractometer
Ultima IV
Rigaku
Used for XRD analysis of KNN bulk ceramic and NWAs.
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JEOL 7800F Schottky field emission scanning microscope
7800F
JEOL
Used for observing the microstructure of the samples.
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WiTec Alpha 300R spectrophotometer
Alpha 300R
WiTec
Used for taking Raman spectra of the samples.
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Lock-in amplifier SR865A
SR865A
Stanford research
Used in conjunction with the XE-7 AFM for PFM measurements.
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Digital oscilloscope
TDS5054B
Tektronix
Used for recording the averaged PA signals.
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KrF excimer laser
Used for ablating targets in the PLD process.
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XE-7 AFM
XE-7
Park Systems
Used for measuring ferroelectric properties by RT-PFM.
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Pulsed laser Nd:YAG
Ekspla NL300
Continuum
Used in the PLPA experimental setup.
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